Magazine Article

A Data Matrix Method for Improving the Quantification of Element Percentages of SEM/EDX Analysis

TBMG-5905

11/01/2009

Abstract
Content

A simple 2D M×N matrix involving sample preparation enables the microanalyst to peer below the noise floor of element percentages reported by the SEM/EDX (scanning electron microscopy/energy dispersive x-ray) analysis, thus yielding more meaningful data.

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Citation
"A Data Matrix Method for Improving the Quantification of Element Percentages of SEM/EDX Analysis," Mobility Engineering, November 1, 2009.
Additional Details
Publisher
Published
Nov 1, 2009
Product Code
TBMG-5905
Content Type
Magazine Article
Language
English