SAE International Journal of Materials and Manufacturing

Editor-in-Chief:

Dr. Yung-Li Lee, FCA USA, LLC
Senior Fellow in Durability at Stellantis (or FCA US LLC, the legal name of the Stellantis member-entity). He has been with Chrysler since 1988, and is responsible for facilitating the development and implementation of state-of-the-art durability technologies for product designs, analysis, and testing. He is also a Fellow of Society of Automotive Engineers (SAE) and an Adjunct Professor in Mechanical Engineering of the Oakland University in Michigan. He received both M.S. and Ph.D. degrees in Structural Engineering from University of Wisconsin-Madison.

Dr. Lee is the Editor-in-Chief of the SAE International Journal of Materials and Manufacturing. He was the recipient of the following awards: 2020 Ernst Gaßner Award from Fraunhofer LBF, 2017 SAE International Leader Citation Award, and 2012 SAE Henry Ford II Distinguished Award. He has co-authored two fatigue textbooks and published more than 100 peer-reviewed publications.

Editorial Board:

Associate Editors
Beena Anand, DTE Energy, USA
Mark E. Barkey, Aerospace Engineering and Mechanics, The University of Alabama, USA
Guofei Chen, General Motors, USA
Anindya Deb, Indian Institute of Science, India
Efthimio Duni, Stellantis, Italy
Salah Elmoselhy, Department of Physics, Faculty of Sciences and Technology, The University of Coimbra, Coimbra, Portugal
Matteo Luca Facchinetti, Stellantis, France
Randy J. Gu, Oakland University, USA
Huairui (Harry) Guo, Stellantis, USA
Shinji Hashimura, Shibaura Institute of Technology, Japan
Yuanding Huang, Helmholtz-Zentrum Hereon, Germany
Kanak Kalita, Vel Tech University, Avadi, India
Hong-Tae Kang, The University of Michigan-Dearborn, USA
Chien-Shing Lee, Purdue University, USA
Fan Li, General Motors, USA
Pai-Chen Lin, National Chung Cheng University, Chia-Yi, Taiwan, R.O.C.
Iris Liu, 51 Consultant, Japan
Vic Liu, GM Global R&D Center, USA
Y. Charles Lu, University of Kentucky, USA
Behzad Mahmoudi, Chevron, USA
Vijaykumar Mannari, Eastern Michigan University, USA
Sean McKelvey, Stellantis, USA
Sandeep Medikonda, Ansys Inc., USA
Zissimos Mourelatos, Oakland University, USA
Jianchao Pang, Institute of Metal Research, Chinese Academy of Sciences, China
Srikanth Pilla, Clemson University, USA
Jose I. Rojas, Universitat Politècnica de Catalunya (UPC BarcelonaTECH), Spain
Siddhesh Vivek Sakhalkar, Western Digital Technologies, Inc., USA
Siegfried Schmauder, University of Stuttgart, Germany
Prabhakar Sharma, Delhi Skill and Entrepreneurship University, Delhi, India
Guangtian (Gavin) Song, Ford Motor Company, USA
Herman Tang, Eastern Michigan University, USA
Ravi Thyagarajan, U.S. Army RDECOM-TARDEC, USA
Jonathan Weiler, Meridian Lightweight Technologies, Canada
Xijia Wu, National Research Council Canada, Canada
Yong Xia, Tsinghua University, China
Hongyi Xu, University of Connecticut, USA
Lianxiang Yang, Oakland University, USA
Xiaobo Yang, Oshkosh Corp., USA
Jay Zhou, JHZ Strategic QA, USA
Shun-Peng Zhu, University of Electronic Science and Technology of China, China
Qian (Beth) Zou, Oakland University, USA