SENT—Single Edge Nibble Transmission for Automotive Applications
- Ground Vehicle Standard
- J2716_201001
- Revised
Scope
Rationale
-
1
Changes meet the new EMC standard IEC 62132-4.
-
2
Addition of an optional pause pulse
-
3
Defining a new enhanced serial message as an optional replacement for the original short serial data message
-
4
Clarifying the diagnostics and remedial actions for successive calibration pulses comparisons
-
5
Added recommended modification to 4-bit checksum calculation. Recommended checksum calculation includes processing a zero nibble in addition to the data nibbles to protect for common error in last data nibble and checksum. The original CRC method is retained as an option for designs already in process or production that were developed according to previous SENT norms.
-
6
Added new recommended circuit topology to better handle 3.3V systems. All new sensors should use the recommended topology. The original topology is retained as an option for designs already in process or production that were developed according to previous SENT norms.
-
7
Added configuration shorthand notation
-
8
Updated MAF, Temperature and Pressure applications to take advantage of the new Enhanced Serial Message
-
9
Added EMC Susceptibility testing guidelines
-
10
Added reset action by transmitter
-
11
Changes for clarifications or to address typos.
Recommended Content
Ground Vehicle Standard | SENT - Single Edge Nibble Transmission for Automotive Applications |
Ground Vehicle Standard | High-Speed CAN (HSC) for Vehicle Applications at 500 kbps with CAN FD Data at 5 Mbps |
Topic
Data Sets - Support Documents
Title | Description | Download |
---|---|---|
Unnamed Dataset 1 | ||
Unnamed Dataset 2 | ||
TABLE 5.2.4.1-1 | STATUS AND COMMUNICATION NIBBLE DESCRIPTION | |
TABLE 5.2.4.3-1 | UNDETECTED 3 AND 4 BIT ERRORS | |
TABLE 5.4.1-1 | BIT FLIP PATTERNS OVER TWO NIBBLES NOT DETECTABLE USING THE CRC POLYNOMIAL | |
TABLE 5.4.1-2 | CHECKSUM MISSED DETECTION RATE, EDGE SHIFT BETWEEN TWO NIBBLES (VALID FRAMES ONLY, RECOMMENDED IMPLEMENTATION) | |
TABLE 5.4.1-3 | CHECKSUM MISSED DETECTION RATE, ASYMMETRICAL EDGE SHIFT OFFSET BY 1 BETWEEN TWO NIBBLES (VALID FRAMES ONLY, RECOMMENDED IMPLEMENTATION) | |
TABLE 6.2.1-1 | COMMUNICATION CLOCK TOLERANCE | |
TABLE 6.3.1-1 | TRANSMITTER DRIVER REQUIREMENTS | |
TABLE 6.3.2-1 | RECEIVER INPUT REQUIREMENTS | |
TABLE 6.3.2-2 | RECEIVER POWER SUPPLY REQUIREMENTS | |
TABLE 7.1-1 | SENT CONFIGURATION SHORTHAND DEFINITION | |
TABLE A-1 | APPLICATION SPECIFIC SENT DATA CHANNEL NIBBLE ORDER | |
TABLE A.1-1 | NIBBLE AND BIT ORDERS FOR SENT THROTTLE APPLICATIONS | |
TABLE A.2.1-1 | DATA CHANNELS FOR MAF SENSORS | |
TABLE A.2.1-2 | NIBBLE AND BIT ORDERS FOR SENT 16-BIT MAF, 8-BIT PRESSURE APPLICATIONS | |
TABLE A.2.1-3 | NIBBLE AND BIT ORDERS FOR SENT 14-BIT MAF, 10-BIT PRESSURE APPLICATIONS | |
TABLE A.2-1 | SHORT SERIAL MESSAGE FORMAT MESSAGE IDS FOR MASS AIR FLOW SENSOR SERIAL DATA | |
TABLE A.2-2 | ERROR CODES FOR MESSAGE ID F, SHORT SERIAL MESSAGE FORMAT MASS AIR FLOW SENSOR SERIAL DATA | |
TABLE A.2.4-1 | MEASUREMENT DATA AND SIGNALING DATA REGIONS OF CHANNEL 1 AND CHANNEL 2 DATA | |
TABLE A.2.5-1 | ERROR CODE / SPECIFIC CODE MESSAGES | |
TABLE A.5.1-1 | EXAMPLE CONFIGURATIONS OF PRESSURE SENSORS AND COMBINED PRESSURE AND TEMPERATURE SENSORS | |
TABLE A.5.1-2 | ALLOCATION OF THE BITS OF THE STATUS AND COMMUNICATION NIBBLE | |
Unnamed Dataset 24 | ||
TABLE A.5.2-1 | MEASUREMENT DATA AND SIGNALING DATA REGIONS OF CHANNEL 1 AND CHANNEL 2 DATA | |
TABLE A.5.3.1.2-1 | LIMITS OF PRESSURE RANGE: POSSIBLE VALUES FOR | |
TABLE A.5.3.1.2-2 | 12-BIT REPRESENTATION OF THE TRANSFER CHARACTERISTIC NODE VALUES (IN PASCAL [PA]) | |
TABLE A.5.3.1.3-1 | PARTITIONING OF THE PRESSURE DATA SPACE WITH DEFAULT Y1 AND Y2 : (Y1=193, Y2=3896) | |
TABLE A.5.7-1 | ERROR CODE / SPECIFIC CODE MESSAGES | |
TABLE B.1-1 | EXAMPLE 4-BIT CHECKSUM CALCULATIONS, LEGACY IMPLEMENTATION | |
TABLE B.1-2 | EXAMPLE 4-BIT CHECKSUM CALCULATIONS, RECOMMENDED IMPLEMENTATION | |
TABLE B.2-1 | EXAMPLE CHECKSUM CALCULATIONS, 6-BIT CRC | |
TABLE C.1 | NUMBER OF WRONG FRAMES FOR ERROR TIME | |
TABLE D.1-1 | SLOW CHANNEL 8-BIT MESSAGE IDS | |
TABLE D.1-1 | SLOW CHANNEL 4-BIT MESSAGE IDS | |
TABLE D.3-1 | SENT REVISION CODES | |
TABLE D.3 D.4-1 | SENT SENSOR CLASSES | |
TABLE D.5-1 | DEFINITION OF DIAGNOSTIC MESSAGES, TRANSMITTED OVER THE SLOW SERIAL CHANNEL | |
TABLE D.6-1 | EXAMPLE: SUB-SET OF MESSAGE IDS THAT ARE USED BY A SENSOR WITHIN ONE SERIAL MESSAGE CYCLE |
Issuing Committee
Vehicle Architecture For Data Communications Standards
The ever-increasing consumer expectations of vehicle internal functions and connectivity to the environment are outstripping the capability of current data communication architecture design. To address this vulnerability, this committee will investigate and endorse new vehicle architectures that meet system requirements such as: Reliability, System design metrics, Data security, Fault Tolerance, Built in testability, Validation/Verification , Compatibility, and Redundancy. This committee's mission is the investigation and development of vehicle architecture and data communication protocols and methods required to achieve the growth expected in the area of vehicle electronics. The committee shall continue to contribute to the understanding and use of semiconductor devices such as microprocessors, power devices, and other integrated circuits and the data transmission media used in these systems. Thus, all vehicle architectures (excluding aircraft) and devices used in these systems shall be included. Specific objectives shall include: Address the effect of electrical power environments (e.g., 42V, ground offsets) , Sponsor forums to evaluate new technologies (e.g., MOST, Bluetooth, Firewire), Publish technical reports on vehicle architecture and system partitioning, interfacing, modes of operation, protocol standards, recommended conformance test methods, and evaluation methods of those standards , Maintain the existing documents relevant to this committee (e.g., glossary of automotive electronics terms, SAE J1213/1), Encourage the applicable industries, government and educational institutions to support the efforts of this committee.