LIN Network for Vehicle Applications Conformance Test
- Ground Vehicle Standard
- J2602-2_202110
- Revised
Scope
Rationale
Recommended Content
Ground Vehicle Standard | LIN Network for Vehicle Applications |
Ground Vehicle Standard | File Structures for a Node Capability File (NCF) and LIN Description File (LDF) |
Ground Vehicle Standard | High-Speed CAN (HSC) for Vehicle Applications at 500 kbps with CAN FD Data at 5 Mbps |
Topic
Data Sets - Support Documents
Title | Description | Download |
---|---|---|
Unnamed Dataset 1 | ||
Unnamed Dataset 2 | ||
Table 1A | Detection of errors by commander-node test plan | |
Table 1B | Detection of errors by commander-node test plan | |
Table 2A | Responder-node task in a commander-node error behavior test plan | |
Table 2B | Responder-node task in a commander-node error behavior test plan | |
Table 3A | Responder-node error behavior test plan | |
Table 3B | Responder-node error behavior test plan | |
Table 4 | Test frame assignments | |
Table 5 | Test variable times | |
Table 6 | Length of sync break low phase test plan | |
Table 7A | Variation of length of sync break low phase test plan | |
Table 7B | Variation of length of sync break low phase test plan | |
Table 8 | Length of sync break delimiter test plan | |
Table 9A | Variation of length of sync break delimiter test plan | |
Table 9B | Variation of length of sync break delimiter test plan | |
Table 10 | Length of header test plan | |
Table 11A | Variation of length of header test plan | |
Table 11B | Variation of length of header test plan | |
Table 12 | Length of frame (DUT as responder-node) test plan | |
Table 13 | Length of frame (DUT as commander-node with responder-node task) test plan | |
Table 14A | Responder-node execution of configuration test plan | |
Table 15A | Hardware selectable DNN test plan | |
Table 16A | Fixed DNN test plan | |
Table 17A | Software programmable DNN test plan | |
Table 18A | Hardware selectable DNN and software programmable DNN test plan | |
Table 18B | Hardware selectable DNN and software programmable DNN test plan | |
Table 19A | Responder-node message ID assignment test plan | |
Table 19B | Responder-node message ID assignment test plan | |
Unnamed Dataset 30 | $3C NAD | |
Unnamed Dataset 31 | $3E NAD | |
Unnamed Dataset 32 | ||
Table 20A | Calibrating/configuring a responder-node test plan | |
Table 21A | Responder-node part number reporting test plan | |
Table 22A | Calibrating/configuring a responder-node test plan | |
Table 22B | Calibrating/configuring a responder-node test plan | |
Table 23A | Commander-node bit time measurement test plan | |
Table 23B | Commander-node bit time measurement test plan for 96μs Bit time | |
Table 23C | Commander-node bit time measurement test plan for 52μs Bit time | |
Table 24A | Responder-node bit time measurement - fixed clock test plan | |
Table 24B | Responder-node bit time measurement - fixed clock test plan | |
Table 24C | Responder-node bit time measurement - fixed clock test plan | |
Table 25A | Responder-node bit time measurement - auto bauding clock test plan | |
Table 25B | Responder-node bit time measurement - auto bauding clock test plan | |
Table 26A | Responder-node bit time measurement - auto baud rate detect test plan | |
Table 27 | Test frame assignments | |
Table 28A | Commander-node wake-up reception | |
Table 28B | Commander-node wake-up reception | |
Table 29A | Responder-node wake-up reception | |
Table 29B | Responder-node wake-up reception | |
Table 30 | Responder-node (or commander-node with responder-node task) wake-up transmission | |
Table 31A | Responder-node wake-up re-transmission | |
Table 31B | Responder-node wake-up re-transmission | |
Table 32A | Responder-node wake-up request | |
Table 33A | Responder-node sleep wake test plan | |
Table 33B | Responder-node sleep wake test plan | |
Table 34A | Commander-node command transmit | |
Table 34B | Responder-node command receive | |
Table 35A | Responder-node sleep on bus idle | |
Table 35B | Responder-node sleep on bus idle | |
Table 36A | Responder-node sleep with LIN bus short to ground | |
Table 36B | Responder-node sleep with LIN bus short to ground | |
Table 37 | LIN bus signals and loading requirements | |
Table 38A | Commander-node V and V levels measurement test plan | |
Table 38B | Commander-node V and V levels measurement test plan | |
Table 39A | Responder-node V and V levels measurement test plan | |
Table 39B | Responder-node V and V levels measurement test plan | |
Table 40A | Commander-node V level measurement test plan | |
Table 40B | Commander-node V level measurement test plan | |
Table 41A | Responder-node V level measurement test plan | |
Table 41B | Responder-node V level measurement test plan | |
Table 42A | Commander-node V level measurement test plan | |
Table 42B | Commander-node V level measurement test plan | |
Table 43A | Responder-node V level measurement test plan | |
Table 43B | Responder-node V level measurement test plan | |
Table 44A | Commander-node D1 and D2 measurement test plan | |
Table 44B | Commander-node D1 and D2 measurement test plan | |
Table 45A | Commander-node D3 and D4 measurement test plan | |
Table 45B | Commander-node D3 and D4 measurement test plan | |
Table 46A | Responder-node D1 and D2 measurement test plan | |
Table 46B | Responder-node D1 and D2 measurement test plan | |
Table 47A | Responder-node D3 and D4 measurement test plan | |
Table 47B | Responder-node D3 and D4 measurement test plan | |
Table 48A | Commander-node resistor measurement test plan | |
Table 49A | Responder-node resistor measurement test plan | |
Table 50A | Commander or responder-node capacitance measurement test plan | |
Table 50B | Commander or responder-node capacitance measurement test plan | |
Table 51A | Max sample point - fixed clock responder-node test plan | |
Table 51B | Max sample point - fixed clock responder-node test plan | |
Table 52A | Min sample point - fixed clock responder-node test plan | |
Table 52B | Min sample point - fixed clock responder-node test plan | |
Table 53A | Max sample point - auto bauding clock responder-node test plan | |
Table 53B | Max sample point - auto bauding clock responder-node test plan | |
Table 54A | Min sample point - auto bauding clock responder-node test plan | |
Table 54B | Min sample point - auto bauding clock responder-node test plan | |
Table 55A | Commander-node sample point test plan | |
Table 55B | Commander-node sample point test plan | |
Table 56A | Loss of ECU ground leakage current measurement test plan | |
Table 56B | Loss of ECU ground leakage current measurement test plan | |
Table 57A | ECU power loss leakage current measurement test plan | |
Table 57B | ECU power loss leakage current measurement test plan | |
Table 58A | Bus wiring short to ground test plan | |
Table 59A | Bus wiring short to battery with TxD/RxD accessible test plan | |
Table 60A | Bus wiring short to battery with TxD/RxD not accessible test plan | |
Table 61A | Normal battery voltage operating range with TxD/RxD accessible test plan | |
Table 61B | Normal battery voltage operating range with TxD/RxD accessible test plan | |
Table 62A | Responder-node normal battery voltage operating range with TxD/RxD not accessible test plan | |
Table 62B | Responder-node normal battery voltage operating range with TxD/RxD not accessible test plan | |
Table 63A | Commander-node normal battery voltage operating range with TxD/RxD not accessible test plan | |
Table 63B | Commander-node normal battery voltage operating range with TxD/RxD not accessible test plan | |
Table 64 | Commander/responder-node battery over-voltage operation with TxD/RxD accessible test plan | |
Table 65 | Responder-node battery over-voltage operation with TxD/RxD not accessible test plan | |
Table 66 | Commander/responder-node low battery operation with TxD/RxD accessible test plan | |
Table 67 | Responder-node low battery operation with TxD/RxD not accessible test plan | |
Table 68 | Commander-node low battery voltage operating range with TxD/RxD not accessible test plan | |
Table 69A | Auto start cranking voltage operating range with TxD/RxD accessible test plan | |
Table 69B | Auto start cranking voltage operating range with TxD/RxD accessible test plan | |
Table 70A | Responder-node auto start cranking voltage operating range with TxD/RxD not accessible test plan | |
Table 70B | Responder-node auto start cranking voltage operating range with TxD/RxD not accessible test plan | |
Table 71A | Commander-node normal battery voltage operating range with TxD/RxD not accessible test plan | |
Table 71B | Commander-node normal battery voltage operating range with TxD/RxD not accessible test plan | |
Table 72 | Commander/responder-node very low battery operation with TxD/RxD accessible test plan | |
Table 73 | Responder-node very low battery operation with TxD/RxD not accessible test plan | |
Table 74A | LIN transceiver supply voltage test plan | |
Table 74B | LIN transceiver supply voltage test plan |
Issuing Committee
Vehicle Architecture For Data Communications Standards
The ever-increasing consumer expectations of vehicle internal functions and connectivity to the environment are outstripping the capability of current data communication architecture design. To address this vulnerability, this committee will investigate and endorse new vehicle architectures that meet system requirements such as: Reliability, System design metrics, Data security, Fault Tolerance, Built in testability, Validation/Verification , Compatibility, and Redundancy. This committee's mission is the investigation and development of vehicle architecture and data communication protocols and methods required to achieve the growth expected in the area of vehicle electronics. The committee shall continue to contribute to the understanding and use of semiconductor devices such as microprocessors, power devices, and other integrated circuits and the data transmission media used in these systems. Thus, all vehicle architectures (excluding aircraft) and devices used in these systems shall be included. Specific objectives shall include: Address the effect of electrical power environments (e.g., 42V, ground offsets) , Sponsor forums to evaluate new technologies (e.g., MOST, Bluetooth, Firewire), Publish technical reports on vehicle architecture and system partitioning, interfacing, modes of operation, protocol standards, recommended conformance test methods, and evaluation methods of those standards , Maintain the existing documents relevant to this committee (e.g., glossary of automotive electronics terms, SAE J1213/1), Encourage the applicable industries, government and educational institutions to support the efforts of this committee.