J1879_201402 Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications

Revised

02/21/2014

Features
Issuing Committee
Scope
Content
This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Where practical, methods of extrinsic reliability detection and prevention will also be addressed. The current handbook primarily focuses on integrated circuit subjects, but can easily be adapted for use in discrete or passive device qualification with the generation of a list of failure mechanisms relevant to those components. Semiconductor device qualification is the main scope of the current handbook.
Other procedures addressing extrinsic defects are particularly mentioned in the monitoring chapter. Striving for the target of Zero Defects in component manufacturing and product use it is strongly recommended to apply this handbook. If it gets adopted as a standard, the term “shall” will represent a binding requirement.
This document does not relieve the supplier of the responsibility to assure that a product meets the complete set of its requirements.
Rationale
Content
Error and issue corrections with latest state of art updates.
Meta TagsDetails
DOI
https://doi.org/10.4271/J1879_201402
Pages
57
Citation
SAE International Recommended Practice, Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications, SAE Standard J1879_201402, Revised February 2014, Issued October 1988, https://doi.org/10.4271/J1879_201402.
Additional Details
Publisher
Published
Feb 21, 2014
Product Code
J1879_201402
Content Type
Recommended Practice
Status
Revised
Language
English

Revisions