Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts
- Aerospace Standard
- AS6171A
- Revised
Scope
-
a
Shall = is mandatory;
-
b
Should = is recommended; and
-
c
Will = is planned (is considered to be part of a standard process).
Rationale
Complimentary SAE Counterfeit Defect Coverage Tool
For those tasked with detecting counterfeit electrical, electronic, and electromechanical (EEE) Parts, the SAE Counterfeit Defect Coverage Tool, in conjunction with SAE AS6171, is a dynamic, web-based application for developing a counterfeit detection test sequence and its associated counterfeit defect coverage while considering the resources necessary to implement those tests.
Recommended Content
Topic
- Quality management systems
- Counterfeit avoidance
- Supply chain management
- Defense industry
- Counterfeit parts
- Supplier assessment
- Charge coupled devices
- Disaster and emergency management
- Data management
- CAD, CAM and CAE
- Failure modes and effects analysis
- Assembling
- Electrical systems
- Electronic equipment
Data Sets - Support Documents
Title | Description | Download |
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Unnamed Dataset 2 | ||
Unnamed Dataset 3 | ||
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Unnamed Dataset 5 | ||
Table 1 | Tier levels and risk scores | |
Table 2 | Product risk categories and values | |
Table 3 | Component risk categories and values | |
Table 4 | Supplier risk definition/score | |
Table 5 | Risk characterization worksheet | |
Table 6A | Models of test sequences to achieve the overall defect coverage threshold for the five risk tier levels - active parts, complex | |
Table 6B | Models of test sequences to achieve the overall defect coverage threshold for the five risk tier levels - active parts, simple | |
Table 7 | Models of test sequences to achieve the overall defect coverage threshold for the five risk tier levels - passive parts | |
Table 8 | Standard lot sampling plan | |
Table 9 | Small lot sampling plan | |
Table 10 | Detailed small lot sampling plan (see notes) | |
Table 11 | Test plan information | |
Table A1 | EEE parts and devices applicability matrix | |
Table C1 | Example 1 scoring | |
Table C2 | Example 2 scoring | |
Table C3 | Example 3 scoring | |
Table C4 | Example 4 scoring | |
Table E9 | Test sequence critical risk, complex active part - Model 1 results | |
Table E18 | Test sequence critical risk, simple active part - Model 1 results | |
Table E27 | Test sequence critical risk, simple passive part - Model 1 results |
Issuing Committee
G-19A Test Laboratory Standards Development Committee
To develop an inspection/test matrix plan for different classes of Electrical, Electronic, and Electromechanical (EEE) commodities to detect suspect and confirmed counterfeit components. The matrix will include recommended visual, physical, electrical, and material testing based on different commodities and associated tier level of determined risk. The plan will include a process for evaluating risk. The plan will provide guidance on the recommended tier level of testing that should be performed based on risk of the supplier, the item, application, and other risk factors. It will also include recommended sampling plans for the tests based on tier level of accepted risk, level of confidence required, and acceptable reject criteria.
Reference
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