This method outlines the requirements, capabilities, and limitations associated with the application of Design Recovery for the detection of counterfeit electronic parts including: Operator training; Sample preparation; Imaging techniques; Data interpretation; Design/functional matching; Equipment maintenance and; Reporting of data. The method is primarily aimed at analyses performed by circuit delayering and imaging with a scanning electron microscope or optical microscope; however, many of the concepts are applicable to other microscope and probing techniques to recover design data. The method is not intended for the purpose of manufacturing copies of a device, but rather to compare images or recover the design for determination of authenticity.
If AS6171/11 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
Rationale
This document was created to provide guidelines for the application of Design Recovery and to define the compliance requirements for laboratories using this technique. Additionally, this document is intended to provide guidance for those unfamiliar with Design Recovery and its application to detection of counterfeit electronic parts. This technique can be used for any risk level as needed to support results from other analysis techniques.
For those tasked with detecting counterfeit electrical,
electronic, and electromechanical (EEE) Parts, the SAE
Counterfeit Defect Coverage Tool, in conjunction with SAE AS6171,
is a dynamic, web-based application for developing a counterfeit
detection test sequence and its associated counterfeit defect
coverage while considering the resources necessary to implement
those tests.
To develop an inspection/test matrix plan for different classes of Electrical, Electronic, and Electromechanical (EEE) commodities to detect suspect and confirmed counterfeit components. The matrix will include recommended visual, physical, electrical, and material testing based on different commodities and associated tier level of determined risk. The plan will include a process for evaluating risk. The plan will provide guidance on the recommended tier level of testing that should be performed based on risk of the supplier, the item, application, and other risk factors. It will also include recommended sampling plans for the tests based on tier level of accepted risk, level of confidence required, and acceptable reject criteria.
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Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
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Techniques for Suspect/Counterfeit EEE Parts Detection by Design Recovery Test Methods
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