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Contacts, Electrical Connector, General Specification For
- Aerospace Standard
- AS39029D
- Revised
Downloadable datasets available
Annotation ability available
Sector:
Issuing Committee:
Language:
English
Scope
This specification covers the general requirements for removable crimp, solderless wrap, and solder type electrical contacts for use in connectors and other electric and electronic components (see 6.1) with stranded conductor wire. The contacts shall be capable of operating within the temperature range as specified (see 3.1).
Rationale
Revision is required to include new detail sheets, include cancelled detail sheets for historical information, to add minimum gold requirement inside the crimp barrel, to clarify the axial concentricity test method for hex crimps, to update wire barrel sizes in Table 3, to correct test pin error in Table 9 and add humidity, temperature cycling and thermal shock to the conditioning tests (footnote), to correct sample numbers in Table 11, to correct footnotes and sample numbers in Table 12, to add weep hole option for specific socket contacts, to add post conditioning Low Level Contact Resistance testing to Table 12, 14 and 15 (Group 1), to reverse the order of the Low Level Resistance and Contact Resistance testing in Table 12 (Group IV), to add a paragraph to clarify optional inner contact designs, to update paragraph 4.7.1.1 to address crimping conditions related to the wire inspection hole, to add temperature column to table 1 and to update the specification appendix.
Recommended Content
Topic
Data Sets - Support Documents
Title | Description | Download |
---|---|---|
Table 1 | Contact types | |
Unnamed Dataset 2 | ||
Unnamed Dataset 3 | ||
Unnamed Dataset 4 | ||
Unnamed Dataset 5 | ||
Unnamed Dataset 6 | ||
Unnamed Dataset 7 | ||
Unnamed Dataset 8 | ||
Table 2 | Pin dimensions at mating end (except type D) | |
Table 3 | Wire barrel range accommodations | |
Table 3 | Wire barrel range accommodations | |
Table 4 | Low signal level contact resistance (Type A) with silver plated wire | |
Table 5 | Contact resistance (Type A) with silver-plated wire | |
Table 6 | Contact resistance (Type A) with nickel-plated wire | |
Table 7 | Contact resistance (Type B) with silver-plated wire | |
Table 8 | Contact resistance (Type B) with nickel-plated wire | |
Table 9 | Contact engagement and separation forces | |
Table 10 | Tensile strength (type A) | |
Table 11 | Random sample quantities | |
Table 12 | Qualification inspection (Types A and B contacts) | |
Table 13 | Qualification inspection (Type C contacts) | |
Table 14 | Qualification inspection (Type D contacts) (see 4.5.2.3) | |
Table 15 | Retention of qualification testing performed by qualifying activity (all contact types as specified) | |
Unnamed Dataset 24 | Similarity Groups | |
Table 16 | Group A inspection | |
Unnamed Dataset 26 |
Issuing Committee
SAE Subcommittee AE-8C1, Connectors, shall be associated with those activities directed by the parent SAE Aerospace Council and the SAE Aerospace Electronics and Electrical Distribution Systems Committee, for the development and application of electrical optical connector and associated hardware standards and specifications. SAE Subcommittee shall also serve the needs of the Navy, Army, and Air Force through the establishment and maintenance of User Advisory Committees.
Reference
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