Measurement of Hemispherical Total Emittance in Cryogenic Temperature
941484
06/01/1994
- Event
- Content
- Measurement of hemispherical total emittance, ε H material for cryogenic engineering in the temperature range of 10∼50K is proposed. This measurement is based on calorimetric method and ε H is obtained by measuring a sample temperature corresponding to heat input to a sample heater. In order to verify this method, the parameter ε H is analyzed for a test chamber by using a thermal mathematical model.
- Pages
- 6
- Citation
- Ohnishi, A., "Measurement of Hemispherical Total Emittance in Cryogenic Temperature," SAE Technical Paper 941484, 1994, https://doi.org/10.4271/941484.