SIMS 500 - Rapid Low Energy Secondary Ion Mass Spectrometer for In-Line Analysis of Gaseous Compounds - Technology and Applications in Automotive Emission Testing

932017

11/01/1993

Event
International Pacific Conference On Automotive Engineering
Authors Abstract
Content
A new multichannel gas analyzer based on ion - neutral interaction principles is introduced. This gas phase secondary ion mass spectrometer using several well defined energy levels for the ionization process quantitatively analyzes gas mixtures without the use of presetection techniques.
A high sensitivity for many compounds together with high cycle rates allows dynamic studies of gaseous emission in the low and sub ppm range.
Transient studies of inorganic compounds like NO, NH3, H2S, COS and SO2 in catalytic converter systems and differentiated Hydrocarbon analyses of C1 to C8 prove the versatility of the instrument.
Meta TagsDetails
DOI
https://doi.org/10.4271/932017
Pages
8
Citation
Villinger, J., Federer, W., Resch, R., Dornauer, A. et al., "SIMS 500 - Rapid Low Energy Secondary Ion Mass Spectrometer for In-Line Analysis of Gaseous Compounds - Technology and Applications in Automotive Emission Testing," SAE Technical Paper 932017, 1993, https://doi.org/10.4271/932017.
Additional Details
Publisher
Published
Nov 1, 1993
Product Code
932017
Content Type
Technical Paper
Language
English