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Failure Analysis Pertaining to Automotive Electronic Products
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English
Abstract
The quality level of automotive electronic products produced in NIPPONDENSO CO., LTD. is such a good level as we evaluate warranty claims by p.p.m. level and not by percent level.
We have carried out exhaustive failure analysis on warranty returns, qualification tests on newly purchased parts, and precise data analysis on warranty claims for many years so that we attain such a good quality level.
We offered those data obtained from above results to the sections concerned. It was remarkable successful that we put improvements for failure causes of semiconductor devices in co-operation with manufacturers of semiconductor devices, In this report, I would like to present the improving processes of semiconductor devices’ failures which are majority of failures of automotive electronic products by indicating some of the failure modes and analized results obtained by using Weibull probability papers.
Authors
Citation
Yamamoto, S., "Failure Analysis Pertaining to Automotive Electronic Products," SAE Technical Paper 811420, 1981, https://doi.org/10.4271/811420.Also In
References
- Yamamoto, Shogo “THE ESTIMATE OF MILEAGE DISTRIBUTION OF CARS” 4th R & M Symposium JUSE Tokyo 1974 283 290
- Kobayashi, Tadashi “FIELD RELIABILITY AND FAILURE OF AUTOMOBILE ELECTRONIC COMPONENTS” 4th R & M Symposium JUSE Tokyo 1974 291 298
- Suzuki, Junjiro “General Aspects of Reliability in Mechanical Engineering” JUSE 1972
- Okada, Tadashi “RELIABILITY OF AUTOMOTIVE ELECTRONIC DEVICES AND PARTS” 8th R & M Symposium JUSE Tokyo 1978 159 164