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Failure Analysis Pertaining to Automotive Electronic Products
ISSN: 0148-7191, e-ISSN: 2688-3627
Published November 01, 1981 by SAE International in United States
Annotation ability available
The quality level of automotive electronic products produced in NIPPONDENSO CO., LTD. is such a good level as we evaluate warranty claims by p.p.m. level and not by percent level.
We have carried out exhaustive failure analysis on warranty returns, qualification tests on newly purchased parts, and precise data analysis on warranty claims for many years so that we attain such a good quality level.
We offered those data obtained from above results to the sections concerned. It was remarkable successful that we put improvements for failure causes of semiconductor devices in co-operation with manufacturers of semiconductor devices, In this report, I would like to present the improving processes of semiconductor devices’ failures which are majority of failures of automotive electronic products by indicating some of the failure modes and analized results obtained by using Weibull probability papers.
CitationYamamoto, S., "Failure Analysis Pertaining to Automotive Electronic Products," SAE Technical Paper 811420, 1981, https://doi.org/10.4271/811420.
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