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Technique for Reliability Circuit Design Review in Space Electronics
ISSN: 0148-7191, e-ISSN: 2688-3627
Published February 01, 1967 by SAE International in United States
Annotation ability available
Design review is becoming a basic requirement during the design and development of military systems. The main purpose of the design review is to increase the system's inherent and operational reliability.
The major portion of this paper is the result of reliability's effort to comply with Paragraph 3.6 of NPC 250-1 Reliability Program Provisions for Space Contractors.
The design review to be discussed is a reliability circuit design review with emphasis placed on what should be reviewed and the review techniques employed.
The basic circuit design review prerequisites, component parts and their ratings, are discussed at the beginning of this paper. The remainder deals with the organization and reviewing of circuits. The review items include worst-case circuit performance, component applications, failure mode analysis, noise rejection, electrical stress, and the determination of component temperatures. Many examples are included to illustrate how each item was accomplished.
This paper is intended not only to give the reliability analyst cognizance of basic design problems and troublesome circuits, but also, to aid him in formulating a design review program.
CitationFranciscovich, P., "Technique for Reliability Circuit Design Review in Space Electronics," SAE Technical Paper 670634, 1967, https://doi.org/10.4271/670634.
- “General Electric Transistor Manual,” Syracuse, New York: Semiconductor Products Department, 7th edition, 1964.
- Embree M. L., “Semiconductor Device Ratings, Their Determination and use in Reliable System Design,” Laureldale, Pennsylvania: Bell Telephone Laboratories Inc., approximately 1962.
- Joyce M. V. and Clarke K. K., “Transistor Circuit Analysis,” Reading, Massachusetts: Addison-Wesley Publishing Company, 1962, pp. 338-339.