This content is not included in your SAE MOBILUS subscription, or you are not logged in.
A Unified Framework for Representing Product Validation Testing Methods and Conducting Reliability Analysis
Journal Article
2016-01-0269
ISSN: 1946-3979, e-ISSN: 1946-3987
Sector:
Topic:
Citation:
Wei, Z., Start, M., Hamilton, J., and Luo, L., "A Unified Framework for Representing Product Validation Testing Methods and Conducting Reliability Analysis," SAE Int. J. Mater. Manf. 9(2):303-314, 2016, https://doi.org/10.4271/2016-01-0269.
Language:
English
References
- Lee, Y.L., Pan, J., Hathaway, R., and Barkey, M., 2005, Fatigue Testing and Analysis: Theory and Practice, Elsevier Butterworth-Heinemann, Boston, USA.
- Yang, G., Life Cycle Reliability Engineering, John Wiley & Sons, 2007.
- O’Connor, P.D.T., Kleyner, A., Practical Reliability Engineering, 5th edition, Wiley, 2012.
- Nelson, W.B., Accelerated Testing: Statistical Models, Test Plans, and Data analysis, John Wiley & Sons, Inc., 2004.
- Meeker, W.Q., Escobar, L.A., Lu, C.J., Accelerated degradation tests: modeling and analysis, Technometrics, 1998, 40, 89-99.
- Meeker, W.Q., Escobar, L.A., A review of accelerated test models, Statistical Science, 2006, 21, 552-577.
- Wei, Z., Lin, S., Luo, L., and Gao, L., "Components Durability, Reliability and Uncertainty Assessments Based on Fatigue Failure Data," SAE Int. J. Mater. Manf. 8(1):80-90, 2015, doi:10.4271/2014-01-2308.
- Neter, J., Wasserman, W., Kutner, M.H., Applied Linear Statistical Models, Richards D. Irwin, Inc., Homewood, IL, 1990.
- Lu, C.J., Meeker, W.Q., Using degradation measures to estimate a time-to-failure distribution, Technometrics, 1993, 34, 161-174.
- Wei, Z., Rebandt, R., Start, M., Gao, L. et al., "Approaches to Achieving High Reliability and Confidence Levels with Small Test Sample Sizes," SAE Int. J. Commer. Veh. 8(2):343-354, 2015, doi:10.4271/2015-01-2758.
- Elishakoff, I., Probabilistic Theory of Structures, second edition, Dover Publications, Inc., Mineola, New York, 1999.
- Marco, S.M., Starkey, W.L., A concept of fatigue damage, Transactions of the ASME, 1954, 76, 627-632.
- Lipson, C., Sheth, N.J., Statistical Design and Analysis of Engineering Experiments, McGraw-Hill, 1973.
- Wei, Z., Yang, F., Lin, S., Harlow, D.G., Failure modes analysis of fatigue S-N test data with small sample size, RQD18-310, 18th ISSAT International Conference on Reliability and Quality in Design (18th ISSAT RQD), July 26-28, 2012, Boston, MA, USA.
- Ryan, B., Joiner, B., Cryer, J., Minitab Handbook : Updated for Release 16, Sixth Edition, Boston, MA, USA, 2012.
- Dodson, B., The Weibull Analysis Handbook, Second Edition, ASQ Quality Press, Milwaukee, Wisconsin, 2006.
- Cohen, A.C., The reflected Weibull distribution, Technometrics, 1973, 15, 867-873.
- Murthy, D.N.P., Xie, M., Jiang, R., Weibull Models, Wiley-Intersceince, 2004, Hoboken, New Jersey
- Meeker, W.Q., Escobar, L.A., Statistical Methods for Reliability Data, New York: John Wiley, 1998.