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APP-Based Diagnostics of E/E Systems with ISO Standardized Technology (MVCI, ODX, OTX, and UDS on DoIP)

Technical Paper
2016-01-0073
ISSN: 0148-7191, e-ISSN: 2688-3627
Published April 05, 2016 by SAE International in United States
Annotation ability available
 
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Language: English