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Improving Quality, Reliability and Profitability of Mobility Electronics Using Systemic Failure Mode Analysis

Journal Article
ISSN: 1946-4614, e-ISSN: 1946-4622
Published April 01, 2014 by SAE International in United States
Improving Quality, Reliability and Profitability of Mobility Electronics Using Systemic Failure Mode Analysis
Citation: Verbitsky, D., "Improving Quality, Reliability and Profitability of Mobility Electronics Using Systemic Failure Mode Analysis," SAE Int. J. Passeng. Cars – Electron. Electr. Syst. 7(2):353-368, 2014,
Language: English


  1. ISO9001-2008 Quality Management Systems. Requirements
  2. AS9100C Quality Management Systems Requirements for Aviation, Space and Defense Organization
  3. ISO/TS 16949, Quality management systems Particular requirements for the application of ISO 9001:2008 for automotive production and relevant service part organizations
  4. Customer Specific Requirements (ISO/TS-16949) Semiconductor Commodity - Jan 12, 2004 Release
  5. MIL-STD-790F-95 Standard Practice For Established Reliability And High Reliability Qualified Products. List Systems For Electrical, Electronic, and Fiber Optic Parts Specifications
  6. MIL-HDBK-338B-Electronic Reliability Design Handbook
  7. MIL-HDBK-217F-95 Notice2. Reliability prediction of electronic equipment
  8. MIL-HDBK-2155-95 Failure Reporting, Analysis and Corrective Action System
  9. MIL-STD-883G- Test Methods Standard Microcircuits
  10. Juran J. M. , Gryna F. M. Juran's Quality Control Handbook 4 McGraw-Hill, Inc. 1993
  11. Kuo Way , Chien Wei-Ting Kary , Kim Taeho Reliability, Yield, and Stress Burn-in Kluwer Academic Publisher Boston 1998 390
  12. Product Reliability, Maintainability, and Supportability Handbook Pecht M. 2 CRC 2009
  13. Condra L. W. Reliability Improvement with Design of Experiments Marcel Decker 2 2001
  14. Moore T. , McKenna R. G. Characterization of Integrated Circuit Packaging Materials Butterworth-Heinemann (MA). Manning Publication (CT) 1993 275
  15. Failure Analysis of Integrated Circuits. Tools and Technique Wagner L. C. Kluwer Academic Publisher Boston 1999 250
  16. Microelectronic Failure Analysis. Desk reference 4 Lee Thomas W. Dr. Pabbisetty S. V. ASM International 2004
  17. Becker W. T. , Shipley R. J. ASM Handbook: V 11: Failure Analysis and Prevention ASM International 10th 2002
  18. Verbitsky D. E. Early Failures and Reliability of Application Specific Components and Devices of Automated Control Systems PhD Dissertation on Technical Sciences Kishinev Polytechnic Institute 1991 397
  19. Verbitsky D. E. , Murthy D. K. Effective Reliability Management for Transit System Life Cycle Proceedings of 57-th Annual Quality Congress ASQ 2003 169 182
  20. Klyatis , L. and Verbitsky , D. Accelerated Reliability/Durability Testing as a Key Factor for Accelerated Development and Improvement of Product/Process Reliability, Durability, and Maintainability SAE Technical Paper 2010-01-0203 2010 10.4271/2010-01-0203
  21. Verbitsky D. E. Profitable Reliability Assurance Using Early Failure Analysis North Jersey ASQ Annual Spring conference 2011
  22. Verbitsky , D. Improving Reliability and Profitability Using the Systemic Failure Analysis Methodology During Reliability Stress Testing SAE Technical Paper 2012-01-0202 2012 10.4271/2012-01-0202
  23. Verbitsky D. E. , Comerford T. N. Systematic Approach to Modern Corded Telephone Early Commutation Failure Analysis Proc. Ann. Reliability & Maintainability Symp. 1999 84 90
  24. Verbitsky D. E. Early Reliability and Failure Analysis of Modern Telephone Audio Systems Proc. Ann. Reliability & Maintainability Symp. 2003 1 11
  25. Verbitsky D. E. Early Reliability and Failures Analysis of Cordless Personal Communication Systems Proc. Ann. Reliability & Maintainability Symp. 2007 179 185
  26. Verbitsky D. E. Typical Super Early Degradation Failures of Muss-Produced Complex Electronics Proc. Ann. Reliability & Maintainability Symp. 2011
  27. Verbitsky D. E. Characteristic Instantaneous Relevant Reversible Failures and Reliability of Modern Mass-Produced Electronics Proc. Ann. Reliability & Maintainability Symp. 2013
  28. Verbitsky D. E. Wafer Reliability Evaluation and Monitoring for InGaAsP Devices 2006 IEEE International Integrated Reliability Workshop (IIRW-2006). Final Report Stanford Sierra Conference Center S. Lake Tahoe, CA 201 204
  29. Verbitsky D. E. Practical Early Reliability and Failures of PCB Solder Joints Applied Reliability Symposium (ARS-2008) Reno, NV 2008
  30. Verbitsky D. E. Enhancement of Intrinsic Multipurpose HALT for Commercial ASIC Using Systematic FA Accelerated Stress Testing and Reliability Workshop (ASTR-2009) IEEE Jersey City October 9 11 2009
  31. Verbitsky D. E. , Franklin P. FTA Technique Addressing Fault Criticality and Interaction in Complex Consumer Communications Proc. Ann. Reliability & Maintainability Symp. , (RAMS-2001) Philadelphia, PA 23 31

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