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Advantages of the Alternative Method for Random Hardware Failures Quantitative Evaluation - a Practical Survey for EPS

Journal Article
2013-01-0190
ISSN: 1946-4614, e-ISSN: 1946-4622
DOI: https://doi.org/10.4271/2013-01-0190
Published April 08, 2013 by SAE International in United States
Advantages of the Alternative Method for Random Hardware Failures Quantitative Evaluation - a Practical Survey for EPS
Sector:
Citation: Svancara, K., Priddy, J., Lovric, T., Miller, J. et al., "Advantages of the Alternative Method for Random Hardware Failures Quantitative Evaluation - a Practical Survey for EPS," SAE Int. J. Passeng. Cars – Electron. Electr. Syst. 6(2):377-388, 2013, https://doi.org/10.4271/2013-01-0190.
Language: English

References

  1. ISO 26262-5 Road vehicles - Functional safety Part 5: Product development at the hardware level 2011
  2. IEC TR 62380 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment 2004
  3. Kemet Ceramic Chip Capacitors, X7R http://www.kemet.com/page/2012%20Product%20Selection%20Guide/$file/2012_Product_Selection_Guide.pdf
  4. TRW Automotive EPS http://www.trw.com/sub_system/electrically_powered_steering
  5. JEDEC, JESD69B Qualification of Silicon Devices http://www.jedec.org/standards-documents/results/taxonomy%3A3139
  6. JEDEC, JESD91A Arrhenius equation http://www.jedec.org/standardsdocuments/dictionary/terms/arrhenius-equation-reliability
  7. Smith D. J. Reliability, Maintainability and Risk, Practical methods for engineers 5th Butterworth-Heinemann 2000
  8. JEDEC, JESD89 Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices http://www.jedec.org
  9. MIL-HDBK-338B Electronic reliability design handbook 1988 http://www.sre.org/pubs/Mil-Hdbk-338B.pdf
  10. ISO 26262-10 Road vehicles - Functional safety Part 10: Guideline on ISO 26262, FDIS 2012-03-12
  11. ISO 26262-4 Road vehicles - Functional safety Part 4: product development at the system level 2011
  12. Wiltschko , T. Comprehensive use of fault tree analysis for an efficient development of functional safety IQPC-Conference: Experience with ISO 26262 28 March 2012 Munich, Germany
  13. Schroeder B. , Pinheiro E. , Weber W. DRAM Errors in the Wild: A Large-Scale Field Study Sigmetrics 2009
  14. Silicon Amnesia: Radiation Induced Soft Errors in Commercial Semiconductor Technology Short Course Presentation, RADECS 2001, 6th European Conference on Effects on Components and Systems Grenoble, France Sept 2001
  15. Infineon datasheet XC2364B, XC2361E http://www.infineon.com Products> Microcontrollers> 16-bit C166 Microcontrollers> XC2300 Family (Safety)> XC23xxB/E-Series
  16. Svancara K. et al. Experience with the second method for EPS hardware analysis: “Evaluation of each cause of safety goal violation due to random hardware failures VDA Automotive SYS Conference 2012
  17. IEC 61784-3:2010 Industrial communication networks - Profiles Part 3: Functional safety fieldbuses - General rules and profile definitions German version EN 61784-3:2010
  18. SN 29500 Failure rates of components, part 1-14

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