Design Curve Construction Based on Two-Stress Level Test Data

2012-01-0069

04/16/2012

Event
SAE 2012 World Congress & Exhibition
Authors Abstract
Content
A design curve, such as a fatigue design S-N curve, is required in engineering design processes. The design curve is usually constructed by analyzing test data, which often exhibit relatively large scatter. For assumed linear test data, two-stress level test plan is commonly used for accelerated life testing (ALT) and subsequent design curve construction. In this paper, based on the two-stress level test plan, a tolerance limit approach is adopted to develop a simple design curve construction procedure. The predicted results from the new method are compared with that of other methods. The advantage of the new method is demonstrated by analyzing the fatigue S-N test data of exhaust components. The determination of minimum sample size is also discussed with a worked table and a graph.
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Details
DOI
https://doi.org/10.4271/2012-01-0069
Pages
13
Citation
Wei, Z., Luo, L., Lin, S., Konson, D. et al., "Design Curve Construction Based on Two-Stress Level Test Data," SAE Technical Paper 2012-01-0069, 2012, https://doi.org/10.4271/2012-01-0069.
Additional Details
Publisher
Published
Apr 16, 2012
Product Code
2012-01-0069
Content Type
Technical Paper
Language
English