Open Architecture Solution for Hardware-in-the-Loop Testing

2008-01-2711

10/07/2008

Event
Commercial Vehicle Engineering Congress & Exhibition
Authors Abstract
Content
Hardware-in-the-loop (HIL) testing has become an essential verification step in the development of vehicle electronics and software systems. New system concepts continue to drive the requirements for HIL systems. The use of an open architecture for HIL testing provides many benefits to meet these requirements quickly and cost effectively. In this paper we will discuss the development of an open architecture HIL system for a J1939 bandwidth study. We will show how this HIL system was used to test and validate that a heavily loaded networks can operate without compromising the performance of safety critical systems
Meta TagsDetails
DOI
https://doi.org/10.4271/2008-01-2711
Pages
9
Citation
Long, L., Gefke, G., and McKay, B., "Open Architecture Solution for Hardware-in-the-Loop Testing," SAE Technical Paper 2008-01-2711, 2008, https://doi.org/10.4271/2008-01-2711.
Additional Details
Publisher
Published
Oct 7, 2008
Product Code
2008-01-2711
Content Type
Technical Paper
Language
English