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Investigation of the Ta5Si3 and Cr5Si3 Phases by XRD and SEM for Microstructural Characterization
Technical Paper
2007-01-2684
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
In recent studies, much research is focused on the silicides alloys based in refractory transitions metal, becoming these materials as potential candidate for structural applications in high-temperatures for the fact of them possess excellent balance of properties. This work presents results of microstructural characterization of the Ta5Si3 and Cr5Si3 alloys, these silicides were obtained by arc melting under argon atmosphere. X-ray diffraction (XRD) and Scanning Electron Microscope (SEM) were used to obtain information about chemical and crystallographic characteristics of the samples generated before and after the heat-treatment.
Authors
- Lívia de Souza Ribeiro - Universidade de São Paulo - USP Escola de Engenharia de Lorena - Lorena, SP, Brasil
- Sergio Tuan Renosto - Universidade de São Paulo - USP Escola de Engenharia de Lorena - Lorena, SP, Brasil
- Paulo Atsushi Suzuki - Universidade de São Paulo - USP Escola de Engenharia de Lorena - Lorena, SP, Brasil
Citation
Ribeiro, L., Renosto, S., and Suzuki, P., "Investigation of the Ta5Si3 and Cr5Si3 Phases by XRD and SEM for Microstructural Characterization," SAE Technical Paper 2007-01-2684, 2007, https://doi.org/10.4271/2007-01-2684.Also In
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