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Diagnostic Technique for Impurities in Low Pressure Neon Lamps
Technical Paper
2000-01-0807
ISSN: 0148-7191, e-ISSN: 2688-3627
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Sector:
Event:
SAE 2000 World Congress
Language:
English
Abstract
The performance of low pressure gas discharge light sources are significantly influenced by small quantities of materials that can be introduced through lamp processing. In this paper the common materials that represent impurities are described and experimental data is provided that detects the threshold of the impurity by tracking emission from the neon discharge. This technique has resolved the presence of hydrogen in the glass tube and the release of hydrocarbons from the getter used with cold cathode electrodes. At temperatures above approximately 200°C, the getter compound starts to release previously trapped materials. For most operational modes of Neon, the glass tube does not exceed 200°C. However, for some Neon Amber turn signal applications the glass temperatures can reach above 250°C. These elevated temperatures can occur particularly for front turn applications that require greater light output than rear applications.
Citation
Evans, J. and Rothwell, H., "Diagnostic Technique for Impurities in Low Pressure Neon Lamps," SAE Technical Paper 2000-01-0807, 2000, https://doi.org/10.4271/2000-01-0807.Also In
References
- Designation of the molecular emissions is based on the terminology from The Identification of Molecular Spectra, Pearse, R.W.B., and Gaydon, A.G., Chapman and Hall Ltd., London, (1984).
- Evans, Jean M. and Rothwell, Harold L. Jr., “The Rare Gas Fluorescent Lamp”, SAE Technical Paper Series No. 1999-01-0702, March 1999.
- Flanagan, R. W. Jr., “Spectra of Neon lamp Contaminants”, Osram Technical Note, Company Private.