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THE EXACT ANALYSIS OF SEQUENTIAL LIFE TESTS WITH PARTICULAR APPLICATION TO AGREE PLANS
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Abstract
In this paper we give methods for the exact analysis of any sequential life test, under the assumption that the underlying distribution of times to failure or times between failure is exponential. The procedure is recursive in nature and can be carried out easily with a modern high-speed computer. The work was stimulated by a desire to study the effect of truncation in sequential life tests and in particular to compute exactly the properties of the life test plans recommended in the AGREE (Advisory Group on the Reliability of Electronic Equipment) report. Roughly speaking, the AGREE plans are obtained by superimposing a truncated test of the type studied by Epstein1 on the sequential life test given by Epstein and Sobel2. The results of these computations are given in detail in the Appendix.
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Citation
Epstein, B., Patterson, [., and Qualls, C., "THE EXACT ANALYSIS OF SEQUENTIAL LIFE TESTS WITH PARTICULAR APPLICATION TO AGREE PLANS," SAE Technical Paper 630556, 1963, https://doi.org/10.4271/630556.Also In
References
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- Aroian, Leo. A. “Exact Truncated Sequential Tests for the Exponential Density Function,” Ninth National Symposium on Reliability and Quality Control , Institute of Radio Engineers, 1 East 79th Street, New York 21, New York 1963 470 486
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- Houghton, H. V. “An Examination of the Effects of Truncation of a Sequential Test,” Master’s Thesis Department of Engineering, University of California at Los Angeles May 1961
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- Advisory Group on Reliability of Electronic Equipment (AGREE), Task Groups Two and Three, Office of the Assistant Secretary of Defense Reliability of Military Electronic Equipment Distributed by U. S. Superintendent of Documents Washington 25, D. C. June 4 1957 75 209