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Real Time Calibration and Debug Techniques of Embedded Processors with the Nexus 5001 Interface
Technical Paper
2003-01-1035
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
Recent technology improvements in the area of embedded processors have changed the methods of debugging and calibration with instruction reconstruction and data collection. This transition has come about in part, due to the System-on-a-Chip (SoC) methodology from silicon vendors and the encapsulation of significant portions of the system on a single piece of silicon. The result is the removal of the external address and data bus and higher performance. Motorola is a leader in the SoC methodology with the integration of Flash memory technology that allows the application to function without an external memory bus. The requirements in real time applications such as engine management and transmission systems have brought on a new requirement for the embedded processor vendor to provide real time information. The IEEE-ISTO Nexus 5001 Consortium has been working to provide a real time debug and calibration specification and standard to address these issues.
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Authors
Topic
Citation
Stence, R., "Real Time Calibration and Debug Techniques of Embedded Processors with the Nexus 5001 Interface," SAE Technical Paper 2003-01-1035, 2003, https://doi.org/10.4271/2003-01-1035.Also In
SAE 2003 Transactions Journal of Passenger Cars - Electronic and Electrical Systems
Number: V112-7; Published: 2004-09-15
Number: V112-7; Published: 2004-09-15
References
- IEEE-ISTO Nexus 5001 Hardware Committee etal “IEEE-ISTO Nexus 5001 Standard, v1.0 1999” www.ieee-isto.org
- Miller G. (Motorola) Hall K. (Agilent Technologies) etal “The Evolution of Powertrain Microcontrollers and it's Impact on Development Processes and Tools” www.ieee-isto.org
- Hugh O'Keeffe (Ashling) “The Nexus 5001 Forum™ Standard providing the Gateway to the Embedded Systems of the Future” www.ieee-isto.org
- James Allen (Delphi) “Calibration Development with Production Intent Electronic Control Units” SAE Paper 00P-487 2000