J1752/1_202109 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

Stabilized

09/21/2021

Features
Issuing Committee
Scope
Content
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
Rationale
Content
This technical report is being stabilized because it covers technology, products, or processes which are mature and not likely to change in the foreseeable future.
Meta TagsDetails
DOI
https://doi.org/10.4271/J1752/1_202109
Pages
18
Citation
SAE International Technical Standard, Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions, SAE Standard J1752/1_202109, Stabilized September 2021, Revised May 2016, Issued March 1997, https://doi.org/10.4271/J1752/1_202109.
Additional Details
Publisher
Published
Sep 21, 2021
Product Code
J1752/1_202109
Content Type
Technical Standard
Status
Stabilized
Language
English