J1752/1_200610 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions
Revised
10/13/2006
- Features
- Issuing Committee
- Content
- This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
- Content
- The intent of this document is to define general test conditions to establish a uniform testing environment and obtain a quantitative measure of the RF emissions from ICs. Critical parameters that are expected to influence the test results are described in this document and any deviations shall be documented in the test report. This revision is being implemented to support advances in the individual; test methods.
- Pages
- 17
- Citation
- SAE International Technical Standard, Electromagnetic Compatibility Measurement Procedures for Integrated Circuits—Integrated Circuit EMC Measurement Procedures—General and Definitions, SAE Standard J1752/1_200610, Revised October 2006, Issued March 1997, https://doi.org/10.4271/J1752/1_200610.