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Measurement of Hemispherical Total Emittance in Cryogenic Temperature
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English
Abstract
Measurement of hemispherical total emittance, ε H material for cryogenic engineering in the temperature range of 10∼50K is proposed. This measurement is based on calorimetric method and ε H is obtained by measuring a sample temperature corresponding to heat input to a sample heater. In order to verify this method, the parameter ε H is analyzed for a test chamber by using a thermal mathematical model.
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Citation
Ohnishi, A., "Measurement of Hemispherical Total Emittance in Cryogenic Temperature," SAE Technical Paper 941484, 1994, https://doi.org/10.4271/941484.Also In
References
- Ohnishi A. Kawada Y. Hayashi T. Hatada T. Tanaka K. “Simultaneous Measurement of Solar Absorptance and Total Hemispherical Emittance” SAE 881043 1988
- Scott, R. “Cryogenic engineering” D. van nostrand company, inc. 1986
- Spark L. L. Powell R. L. “Low temperature thermocouple” J. of. NBS 176A 1972