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Semiconductor devices (194) Integrated circuits (38) Semiconductors (32) Power electronics (20) Test procedures (20) Sensors and actuators (19) Transistors (19) Fabrication (17) Electronic equipment (16) Optics (15) Research and development (15) Architecture (14) Switches (14) Electronic control systems (13) High voltage systems (13) Light emitting diodes (LEDs) (13) Identification numbers (12) Conductivity (11) Imaging and visualization (11) Suppliers (11) Thermal management (11) Assembling (10) Counterfeit parts (10) Electric vehicles (10) Hybrid electric vehicles (10) Simulation and modeling (10) Supply chain management (10) Computer software and hardware (9) Electric power (9) Electrical systems (9) Electromagnetic compatibility (9) Failure analysis (9) Failure modes and effects analysis (9) Lasers (9) Logistics (9) Manufacturing processes (9) Reliability (9) Aircraft (8) Control systems (8) Magnetic materials (8) Connectors and terminals (7) Gases (7) Heat transfer (7) 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Authors

Costlow, Terry (3) Kucinski, William (3) Birch, Stuart (2) Dominik, Laura (2) Frank, Randy (2) Rosenberg, Barry (2) Sridharan, Kesav Kumar (2) Valentine, Richard (2) Viswanathan, Swaminathan (2) AGARWAL, PAUL D. (1) Adhikari, Jeevan (1) Alam, Mohammed Khorshed (1) Albrecht, Thomas L. (1) Alves, Marco Antonio Robert (1) Angstenberger, Joerg (1) Ansari, Ajmal (1) Arai, Kenji (1) Arsalan, Ali (1) Ashley, Steven (1) Barkley, Adam (1)

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SAE (118) TBMG (69) SAEITC-IA (2) ARAI (1) ASM (1) CTEA (1) JSAE (1) OSTI (1)

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Motorola Semiconductor Products Sector (3) Infineon Technologies (2) Toyota Motor Corporation (2) Air Force Wright Aeronautical Labs., Wright-Patterson AFB, OH (1) Arkansas Power Electronics International, Inc. (1) CALCE Center, UMD (1) Clemson University (1) Continental Automotive Systems (1) DENSO CORPORATION (1) DaimlerChrysler AG, Germany (1) Delco Electronics General Motors Corp. (1) Delco Electronics, GMC, Kokomo, IN (1) Delphi Automotive (1) Delphi Automotive Systems (1) Delphi Corporation (1) Delphi Corporation, Delphi Packard Electrical / Electronic Architecture (1) Delphi Corporation, Unicamp (1) Electronic Quality Assurance Dept. Nippondenso Co., Ltd. Kariya-shi, Aichi-ken, Japan (1) Ford Motor Company (1) Freescale Semiconductor, Inc. (1)

Committees

APMC Avionics Process Management (10) CE-12 Solid State Devices (8) A-20C Interior Lighting (3) Electromagnetic Compatibility (EMC) Standards (3) G-19 Counterfeit Electronic Parts Committee (3) Signaling and Marking Devices Stds Comm (3) Truck and Bus Electrical Systems Committee (3) A-6A2 Military Aircraft Committee (2) AE-7B Power Management, Distribution and Storage (2) Airlines Electronic Engineering Committee (2)

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SAE International Congress and Exposition (4) Future Transportation Technology Conference & Exposition (3) Aerospace Power Systems Conference (2) Convergence International Congress & Exposition On Transportation Electronics (2) Pre-1964 SAE Technical Papers (2) SAE 2004 World Congress & Exhibition (2) SAE 2015 World Congress & Exhibition (2) SAE 2016 Aerospace Systems and Technology Conference (2) SAE 2016 World Congress and Exhibition (2) SAE World Congress & Exhibition (2) WCX™ 17: SAE World Congress Experience (2) 1967 Automotive Engineering Congress and Exposition (1) 2008 SAE Brasil Congress and Exhibit (1) AeroTech (1) Aerospace Systems and Technology Conference (1) Aerospace Technology Conference and Exposition (1) Avionics Systems (1) Energy & Propulsion Conference & Exhibition (1) Future Car Congress (1) International Colloquium on Automotive Electronic Technology (1)

Series

700 Series (2)

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Select How 3D printing could add efficiency to EV power electronics

How 3D printing could add efficiency to EV power electronics

Automotive Engineering: May 2021

Magazine Article
21AUTP05_08

Published 2021-05-01 by SAE International in United States

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Select Potential Nanotechnology Applications on Automotive Electrical / Electronic Architecture

Potential Nanotechnology Applications on Automotive Electrical / Electronic Architecture

Technical Paper
2008-36-0045
DOI: https://doi.org/10.4271/2008-36-0045

Published 2008-10-07 by SAE International in United States

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Select Graphene-Silicon Devices for Optoelectronics Applications

Graphene-Silicon Devices for Optoelectronics Applications

Magazine Article
TBMG-34628

Published 2019-06-01 by Tech Briefs Media Group in United States

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Select Los Alamos High-Energy Neutron Testing Handbook

Los Alamos High-Energy Neutron Testing Handbook

SAE International Journal of Advances and Current Practices in Mobility

Journal Article
2020-01-0054

Published 2020-03-10 by SAE International in United States

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Select Transient Thermal Model Evaluation for Semiconductor Devices in Automotive Applications

Transient Thermal Model Evaluation for Semiconductor Devices in Automotive Applications

Technical Paper
2017-26-0350
DOI: https://doi.org/10.4271/2017-26-0350

Published 2017-01-10 by SAE International in United States

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Select Improved Photon-Emission-Microscope System

Improved Photon-Emission-Microscope System

Magazine Article
TBMG-12081

Published 2006-05-01 by Tech Briefs Media Group in United States

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Select Array of Bolometers for Submillimeter-Wavelength Operation

Array of Bolometers for Submillimeter-Wavelength Operation

Magazine Article
TBMG-1204

Published 2007-02-01 by Tech Briefs Media Group in United States

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Select SiC Multi-Chip Power Modules as Power-System Building Blocks

SiC Multi-Chip Power Modules as Power-System Building Blocks

Magazine Article
TBMG-1173

Published 2007-02-01 by Tech Briefs Media Group in United States

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Select Resonant Tunneling Spin Pump

Resonant Tunneling Spin Pump

Magazine Article
TBMG-2314

Published 2007-10-01 by Tech Briefs Media Group in United States

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Select Failure Analysis Pertaining to Automotive Electronic Products

Failure Analysis Pertaining to Automotive Electronic Products

Technical Paper
811420
DOI: https://doi.org/10.4271/811420

Published 1981-11-01 by SAE International in United States

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