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Digital Twins for Prognostic Profiling

Altair Engineering India Pvt Ltd-Painuri Thukaram
Altair Engineering India Pvt , Ltd.-Sreeram Mohan
  • Technical Paper
  • 2019-28-2456
To be published on 2019-11-21 by SAE International in United States
Digital Twins for Prognostic Profiling Authors: Sreeram Mohan*, Painuri Thukaram**, Panduranga Rao*** Objective / Question: Ability to have least failures in products on the field with minimum effort from the manufacturers is a major area of focus driven by Industry 4.0 initiatives. Amidst traditional methods of performing system / subsystem level tests often does not enable the complete coverage of a machine health performance predictions. This paper highlights a workable workflow that could be used as a template while considering system design especially employing Digital Twins that help in mimicking real-life scenarios early in the design cycle to increase product’s reliability as well as tend to near zero defects. Methodology: With currently available disruptive technologies , systems are integrated multi-domain 'mechatronics' systems operating in closed-loop/close-interaction. This poses great challenges to system health monitoring as failure of any component can trigger catastrophic system failures. It may be the reason that component failures, as per some aerospace reports, are found to be major contributing factors to aircraft loss-of-control. Essentially, it is either too expensive or impossible to…