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Renosto, Sergio Tuan
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Investigation of the Ta5Si3 and Cr5Si3 Phases by XRD and SEM for Microstructural Characterization

Published 2007-11-28 by SAE International in United States
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HWBE and FE Growths Techniques of the Semiconductors Compounds with Applications in Thermal Infrared Devices

Published 2007-11-28 by SAE International in United States
Annotation ability available