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Requirements for Accreditation Bodies when Accrediting Test Laboratories Performing Detection of Suspect/Counterfeit in Accordance with AS6171 General Requirements and the Associated Test Methods

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6810
  • Current
Published 2018-05-16 by SAE International in United States
The criteria defined herein shall be utilized by an ISO/IEC 17025 Accreditation Body (AB) to establish conformance with AS6171 Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts and associated AS6171 Test Methods requested/included on the scope of accreditation.
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Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171A
  • Current
Published 2018-04-18 by SAE International in United States
This SAE Aerospace Standard (AS) standardizes inspection and test procedures, workmanship criteria, and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts. The requirements of this document apply once a decision is made to use parts with unknown chain of custody that do not have pedigree back to the original component manufacturer or have been acquired from a broker or independent distributor, or when there are other known risk elements that result in the User/Requester to have concerns about potential SC EEE parts. The tests specified by this standard may also detect occurrences of malicious tampering, although the current version of this standard is not designed specifically for this purpose. This standard ensures consistency across the supply chain for test techniques and requirements based on assessed risk associated with the application, component, supplier, and other relevant risk factors. The requirements of this document supplement the requirements of a higher-level quality standard (e.g., AS9100, AS9003, AS9120, ISO 9001) and other quality management system documents. They are not intended to stand…
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Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171/2A
  • Current
Published 2017-05-11 by SAE International in United States
This document describes the requirements of the following test methods for counterfeit detection of electronic components: a Method A: General EVI, Sample Selection, and Handling b Method B: Detailed EVI, including Part Weight measurement c Method C: Testing for Remarking d Method D: Testing for Resurfacing e Method E: Part Dimensions measurement f Method F: Surface Texture Analysis using SEM The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
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Suspect/Counterfeit Test Evaluation Method

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171/1
  • Current
Published 2016-10-30 by SAE International in United States
This document describes an assessment of the effectiveness of a specified test plan used to screen for counterfeit parts. The assessment includes the determination of the types of defects detected using a specified test plan along with the related counterfeit type coverage. The output of this evaluation will produce Counterfeit Defect Coverage (CDC), Counterfeit Type Coverage (CTC), Not-Covered Defects (NCDs), and Under-Covered Defects (UCDs). This information will be supplied to the test laboratory’s customer in both the test report and the Certificate of Quality Conformance (CoQC). This evaluation method does not address the effectiveness of detecting tampered type devices. The Test Evaluation Method also describes an Optimized Test Sequence Selection, in which a test sequence is selected that maximizes the CDC utilizing test cost and time as constraints, for any tier level except the Critical Risk Level. The constraints can be adjusted until the desired CDC is achieved. The output of the Optimized Test Sequence Selection also includes CTC, NCDs, and UCDs. If AS6171/1 is invoked in the contract, the base document, AS6171 General Requirements…
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Techniques for Suspect/Counterfeit EEE Parts Detection by X-ray Fluorescence Test Methods

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171/3
  • Current
Published 2016-10-30 by SAE International in United States
XRF technique for counterfeit detection is applicable to electrical, electronic and electromechanical (EEE) parts as listed in AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts. If AS6171/3 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
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Techniques for Suspect/Counterfeit EEE Parts Detection by Radiological Test Methods

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171/5
  • Current
Published 2016-10-30 by SAE International in United States
The intent of this document is to define the methodology for suspect parts inspection using radiological inspection. The purpose of radiology for suspect counterfeit part inspection is to detect deliberate misrepresentation of a part, either at the part distributor or original equipment manufacturer (OEM) level. Radiological inspection can also potentially detect unintentional damage to the part resulting from improper removal of part from assemblies, which may include, but not limited to, prolonged elevated temperature exposure during desoldering operations or mechanical stresses during removal. Radiological inspection of electronics includes film radiography and filmless radiography such as digital radiography (DR), real time radiography (RTR), and computed tomography (CT). Radiology is an important tool used in part verification of microelectronic devices. Radiographic analysis is performed on parts to verify that the internal package or die construction is consistent with an exemplar. In case an exemplar is not available, comparisons should be made within a homogenous sample population using the technical data available for that item. If AS6171/5 is invoked in the contract, the base document, AS6171 General Requirements…
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Techniques for Suspect/Counterfeit EEE Parts Detection by Thermogravimetric Analysis (TGA) Test Methods

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171/10
  • Current
Published 2016-10-30 by SAE International in United States
This test method provides the capabilities, limitations, and suggested possible applications of TGA as it pertains to the detection of counterfeit electronic components. Additionally, this document outlines requirements associated with the application of TGA including: equipment requirements, test sample requirements, methodology, control and calibration, data analysis, reporting, and qualification and certification. If AS6171/10 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
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Techniques for Suspect/Counterfeit EEE Parts Detection by Electrical Test Methods

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171/7
  • Current
Published 2016-10-30 by SAE International in United States
The scope of this document is to: 1 Specify techniques to detect SC parts using electrical testing. 2 Provide various levels of electrical testing that can be used by the User to define test plans for detecting SC parts. 3 Provide minimum requirements for testing laboratories so that User/Requester can determine which test houses have the necessary capabilities. (For example: technical knowledge, equipment, procedures and protocols for performing electrical testing for verification analysis.) Note: User/Requester is defined in AS6171 General Requirements 4 Specify Burn-In and environmental tests. The environmental tests include Temperature Cycling for Active Devices and Thermal Shock for Passive Devices. Seal Tests are described and recommended for hermetic devices. The following terminology is used throughout this document: a Shall = is mandatory; b Should = is recommended; and c Will = is planned (is considered to be part of a standard process). If AS6171/7 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
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Techniques for Suspect/Counterfeit EEE Parts Detection by Fourier Transform Infrared Spectroscopy (FTIR) Test Methods

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171/9
  • Current
Published 2016-10-30 by SAE International in United States
This document defines capabilities and limitations of FTIR spectroscopy as it pertains to counterfeit electronic component detection and suggests possible applications to these ends. Additionally, this document outlines requirements associated with the application of FTIR spectroscopy including: operator training, sample preparation, various sampling techniques, data interpretation, computerized spectral matching including pass/fail criteria, equipment maintenance, and reporting of data. The discussion is primarily aimed at analyses performed in the mid-infrared (IR) from 400 to 4000 wavenumbers; however, many of the concepts are applicable to the near and far IR. If AS6171/9 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
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Test Methods Standard; General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical Parts

G-19A Test Laboratory Standards Development Committee
  • Aerospace Standard
  • AS6171
  • Historical
Published 2016-10-30 by SAE International in United States
This SAE Aerospace Standard (AS) standardizes inspection and test procedures, workmanship criteria, and minimum training and certification requirements to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) parts. The requirements of this document apply once a decision is made to use parts with unknown chain of custody that do not have pedigree back to the original component manufacturer, or have been acquired from a broker or independent distributor, or when there are other known risk elements that result in the User/Requester to have concerns about potential SC EEE parts. The tests specified by this standard may also detect occurrences of malicious tampering, although the current version of this standard is not designed specifically for this purpose. This standard ensures consistency across the supply chain for test techniques and requirements based on assessed risk associated with the application, component, supplier, and other relevant risk factors. The requirements of this document supplement the requirements of a higher level quality standard (e.g., AS9100, AS9003, AS9120, ISO 9001) and other quality management system documents. They are not intended to…
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