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Measurement of Radiated Emissions From Integrated Circuits-Tem/Wideband Tem (Gtem) Cell Method; Tem Cell (150 Khz to 1 Ghz), Wideband Tem Cell (150 Khz to 8 Ghz)

  • Ground Vehicle Standard
  • J1752/3_199503
  • Historical
Published 1995-03-01 by SAE International in United States
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Measurement of Radiated Emissions From Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 Mhz to 3 Ghz

  • Ground Vehicle Standard
  • J1752/2_199503
  • Historical
Published 1995-03-01 by SAE International in United States