Software-Connected Wafer Level Reliability Test

  • Magazine Article
  • TBMG-38353
Published January 01, 2021 by Tech Briefs Media Group in United States
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Language:
  • English

A key measure driving performance in semiconductor integrated circuits (ICs) is reliability. As ICs continue to become smaller and chip complexity increases, manufacturers need to ensure they can continue to provide the same level of reliability to their customers for mission-critical end applications.