Measuring Surface Roughness with an Atomic Force Microscope
- Magazine Article
- TBMG-37676
Sector:
Language:
- English
Topic:
Thin films and engineered surfaces are used in a myriad of applications including semiconductor electronics, data storage, and precision optics. In many cases, surface roughness and related texture of these device components directly impact their overall quality and performance. Measurements of surface roughness and morphology can be essential, whether to validate an individual processing step or to obtain a quality control metric for the final product.