Novel Characterization Methods for Anisotropic and Mixed-Conduction Materials

  • Magazine Article
  • TBMG-33771
Published February 01, 2019 by Tech Briefs Media Group in United States
Language:
  • English

State-of-the-art electronic and optoelectronic devices require electronic materials with specialized properties that cannot be characterized with standard methods, or that must be characterized with extra precision. As a result of this research, the following new materials characterization methods have been developed: