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Qualification and Reliability Monitors
- Aerospace Standard
- SSB1_001
- Stabilized
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Sector:
Issuing Committee:
Language:
English
Scope
This document is an annex to EIA Engineering Bulletin SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications (the latest revision).
The scope of this document is to establish the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.
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Data Sets - Support Documents
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Issuing Committee
The CE-12 Solid State Devices Committee develops solutions to technical problems in the application, standardization, and reliability of solid state devices. This is implemented by evaluation and preparation of recommendations for specifications, standards, and other documents, both government and industry, to assure that solid state devices are suitable for their intended purposes.
Reference
| Number | Title |
|---|---|
| CDF-AEC-Q100 | This document is not part of the subscrption. |
| CDF-AED-Q101 | This document is not part of the subscrption. |
| EIA J-STD-020 | This document is not part of the subscrption. |
| EIA JESD-22 | This document is not part of the subscrption. |
| EIA JESD-22A | This document is not part of the subscrption. |
| MIL-STD-750 | This document is not part of the subscrption. |
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