LIN Network for Vehicle Applications Conformance Test
- Ground Vehicle Standard
- J2602/2_201211
- Revised
Scope
Rationale
Topic
Data Sets - Support Documents
Title | Description | Download |
---|---|---|
Unnamed Dataset 1 | ||
TABLE 1A | DETECTION OF ERRORS BY MASTER TEST PLAN | |
TABLE 1B | DETECTION OF ERRORS BY MASTER TEST PLAN | |
TABLE 2A | SLAVE NODE ERROR BEHAVIOR TEST PLAN | |
TABLE 2B | SLAVE NODE ERROR BEHAVIOR TEST PLAN | |
TABLE 3A | SLAVE TASK IN A MASTER NODE ERROR BEHAVIOR TEST PLAN | |
TABLE 3B | SLAVE TASK IN A MASTER NODE ERROR BEHAVIOR TEST PLAN | |
TABLE 4 | TEST FRAME ASSIGNMENTS | |
TABLE 5 | TEST VARIABLE TIMES | |
TABLE 6 | LENGTH OF SYNCH BREAK LOW PHASE TEST PLAN | |
TABLE 7A | VARIATION OF LENGTH OF SYNCH BREAK LOW PHASE TEST PLAN | |
TABLE 7B | VARIATION OF LENGTH OF SYNCH BREAK LOW PHASE TEST PLAN | |
TABLE 8 | LENGTH OF SYNCH BREAK DELIMITER TEST PLAN | |
TABLE 9A | VARIATION OF LENGTH OF SYNCH BREAK DELIMITER TEST PLAN | |
TABLE 9B | VARIATION OF LENGTH OF SYNCH BREAK DELIMITER TEST PLAN | |
TABLE 10 | LENGTH OF HEADER TEST PLAN | |
TABLE 11A | VARIATION OF LENGTH OF HEADER TEST PLAN | |
TABLE 11B | VARIATION OF LENGTH OF HEADER TEST PLAN | |
TABLE 12 | LENGTH OF FRAME (DUT AS SLAVE) TEST PLAN | |
TABLE 13 | LENGTH OF FRAME (DUT AS MASTER WITH SLAVE TASK) TEST PLAN | |
TABLE 14A | SLAVE EXECUTION OF CONFIGURATION TEST PLAN | |
TABLE 15A | HARDWARE SELECTABLE DNN TEST PLAN | |
TABLE 16A | FIXED DNN TEST PLAN | |
TABLE 17A | SOFTWARE PROGRAMMABLE DNN TEST PLAN | |
TABLE 18A | HARDWARE SELECTABLE DNN AND SOFTWARE PROGRAMMABLE DNN TEST PLAN | |
TABLE 18B | HARDWARE SELECTABLE DNN AND SOFTWARE PROGRAMMABLE DNN TEST PLAN | |
TABLE 19A | SLAVE MESSAGE ID ASSIGNMENT TEST PLAN | |
TABLE 19B | SLAVE MESSAGE ID ASSIGNMENT TEST PLAN | |
Unnamed Dataset 29 | ||
TABLE 20A | BROADCAST RESET SLAVE RESPONSE TEST PLAN | |
TABLE 21A | CALIBRATING/CONFIGURING A SLAVE TEST PLAN | |
TABLE 22A | SLAVE PART NUMBER REPORTING TEST PLAN | |
TABLE 23A | CALIBRATING/CONFIGURING A SLAVE TEST PLAN | |
TABLE 23B | CALIBRATING/CONFIGURING A SLAVE TEST PLAN | |
TABLE 24A | MASTER NODE BIT TIME MEASUREMENT TEST PLAN | |
TABLE 24B | MASTER NODE BIT TIME MEASUREMENT TEST PLAN | |
TABLE 25A | SLAVE NODE BIT TIME MEASUREMENT - FIXED CLOCK TEST PLAN | |
TABLE 25B | SLAVE NODE BIT TIME MEASUREMENT - FIXED CLOCK TEST PLAN | |
TABLE 26A | SLAVE NODE BIT TIME MEASUREMENT - AUTOBAUDING CLOCK TEST PLAN | |
TABLE 26B | SLAVE NODE BIT TIME MEASUREMENT - AUTOBAUDING CLOCK TEST PLAN | |
TABLE 27 | TEST FRAME ASSIGNMENTS | |
TABLE 28A | MASTER NODE WAKE-UP RECEPTION | |
TABLE 28B | MASTER NODE WAKE-UP RECEPTION | |
TABLE 29A | SLAVE NODE WAKE-UP RECEPTION | |
TABLE 29B | SLAVE NODE WAKE-UP RECEPTION | |
TABLE 30 | SLAVE NODE (OR MASTER NODE WITH SLAVE TASK) WAKE-UP TRANSMISSION | |
TABLE 31A | SLAVE NODE WAKE-UP RE-TRANSMISSION | |
TABLE 31B | SLAVE NODE WAKE-UP RE-TRANSMISSION | |
TABLE 32A | SLAVE NODE WAKE-UP REQUEST | |
TABLE 33 | MASTER NODE COMMAND TRANSMIT | |
TABLE 34 | SLAVE NODE COMMAND RECEIVE | |
TABLE 35A | SLAVE NODE SLEEP ON BUS IDLE | |
TABLE 35B | SLAVE NODE SLEEP ON BUS IDLE | |
TABLE 36A | SLAVE NODE SLEEP WITH LIN BUS SHORT TO GROUND | |
TABLE 36B | SLAVE NODE SLEEP WITH LIN BUS SHORT TO GROUND | |
TABLE 37 | LIN BUS SIGNALS AND LOADING REQUIREMENTS | |
TABLE 38A | MASTER NODE V AND V LEVELS MEASUREMENT TEST PLAN | |
TABLE 38B | MASTER NODE V AND V LEVELS MEASUREMENT TEST PLAN | |
TABLE 39A | SLAVE NODE V AND V LEVELS MEASUREMENT TEST PLAN | |
TABLE 39B | SLAVE NODE V AND V LEVELS MEASUREMENT TEST PLAN | |
TABLE 40A | MASTER NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 40B | MASTER NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 41A | SLAVE NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 41B | SLAVE NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 42A | MASTER NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 42B | MASTER NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 43A | SLAVE NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 43B | SLAVE NODE V LEVEL MEASUREMENT TEST PLAN | |
TABLE 44A | MASTER NODE T AND T MEASUREMENT TEST PLAN | |
TABLE 44B | MASTER NODE T AND T MEASUREMENT TEST PLAN | |
TABLE 45A | SLAVE NODE T AND T MEASUREMENT TEST PLAN | |
TABLE 45B | SLAVE NODE T AND T MEASUREMENT TEST PLAN | |
TABLE 46A | MASTER NODE RESISTOR MEASUREMENT TEST PLAN | |
TABLE 47A | SLAVE NODE RESISTOR MEASUREMENT TEST PLAN | |
TABLE 48A | MASTER OR SLAVE NODE CAPACITANCECAPACITANCE MEASUREMENT TEST PLAN | |
TABLE 48B | MASTER OR SLAVE NODE CAPACITANCE MEASUREMENT TEST PLAN | |
TABLE 49A | MAX SAMPLE POINT - FIXED CLOCK SLAVE TEST PLAN | |
TABLE 49B | MAX SAMPLE POINT - FIXED CLOCK SLAVE TEST PLAN | |
TABLE 50A | MIN SAMPLE POINT - FIXED CLOCK SLAVE TEST PLAN | |
TABLE 50B | MIN SAMPLE POINT - FIXED CLOCK SLAVE TEST PLAN | |
TABLE 51A | MAX SAMPLE POINT - AUTOBAUDING CLOCK SLAVE TEST PLAN | |
TABLE 51B | MAX SAMPLE POINT - AUTOBAUDING CLOCK SLAVE TEST PLAN | |
TABLE 52A | MIN SAMPLE POINT - AUTOBAUDING CLOCK SLAVE TEST PLAN | |
TABLE 52B | MIN SAMPLE POINT - AUTOBAUDING CLOCK SLAVE TEST PLAN | |
TABLE 53A | MASTER SAMPLE POINT TEST PLAN | |
TABLE 53B | MASTER SAMPLE POINT TEST PLAN | |
TABLE 54A | LOSS OF ECU GROUND LEAKAGE CURRENT MEASUREMENT TEST PLAN | |
TABLE 54B | LOSS OF ECU GROUND LEAKAGE CURRENT MEASUREMENT TEST PLAN | |
TABLE 55A | ECU POWER LOSS LEAKAGE CURRENT MEASURMENT TEST PLAN | |
TABLE 55B | ECU POWER LOSS LEAKAGE CURRENT MEASURMENT TEST PLAN | |
TABLE 56A | BUS WIRING SHORT TO GROUND TEST PLAN | |
TABLE 57A | BUS WIRING SHORT TO BATTERY WITH TXD/RXD ACCESSIBLE TEST PLAN | |
TABLE 58A | BUS WIRING SHORT TO BATTERY WITH TXD/RXD NOT ACCESSIBLE TEST PLAN | |
TABLE 59A | NORMAL BATTERY VOLTAGE OPERATING RANGE WITH TXD/RXD ACCESSIBLE TEST PLAN | |
TABLE 59B | NORMAL BATTERY VOLTAGE OPERATING RANGE WITH TXD/RXD ACCESSIBLE TEST PLAN | |
TABLE 60A | SLAVE NORMAL BATTERY VOLTAGE OPERATING RANGE WITH TXD/RXD NOT ACCESSIBLE TEST PLAN | |
TABLE 60B | SLAVE NORMAL BATTERY VOLTAGE OPERATING RANGE WITH TXD/RXD NOT ACCESSIBLE TEST PLAN | |
TABLE 61A | MASTER NORMAL BATTERY VOLTAGE OPERATING RANGE WITH TXD/RXD NOT ACCESSIBLE TEST PLAN | |
TABLE 61B | MASTER NORMAL BATTERY VOLTAGE OPERATING RANGE WITH TXD/RXD NOT ACCESSIBLE TEST PLAN | |
TABLE 62 | MASTER / SLAVE BATTERY OVER-VOLTAGE OPERATION WITH TXD/RXD ACCESSIBLE TEST PLAN | |
TABLE 63 | SLAVE BATTERY OVER-VOLTAGE OPERATION WITH TXD/RXD NOT ACCESSIBLE TEST PLAN | |
TABLE 64 | MASTER / SLAVE LOW BATTERY OPERATION WITH TXD/RXD ACCESSIBLE TEST PLAN | |
TABLE 65 | SLAVE LOW BATTERY OPERATION WITH TXD/RXD NOT ACCESSIBLE TEST PLAN |
Issuing Committee
Vehicle Architecture For Data Communications Standards
The ever-increasing consumer expectations of vehicle internal functions and connectivity to the environment are outstripping the capability of current data communication architecture design. To address this vulnerability, this committee will investigate and endorse new vehicle architectures that meet system requirements such as: Reliability, System design metrics, Data security, Fault Tolerance, Built in testability, Validation/Verification , Compatibility, and Redundancy. This committee's mission is the investigation and development of vehicle architecture and data communication protocols and methods required to achieve the growth expected in the area of vehicle electronics. The committee shall continue to contribute to the understanding and use of semiconductor devices such as microprocessors, power devices, and other integrated circuits and the data transmission media used in these systems. Thus, all vehicle architectures (excluding aircraft) and devices used in these systems shall be included. Specific objectives shall include: Address the effect of electrical power environments (e.g., 42V, ground offsets) , Sponsor forums to evaluate new technologies (e.g., MOST, Bluetooth, Firewire), Publish technical reports on vehicle architecture and system partitioning, interfacing, modes of operation, protocol standards, recommended conformance test methods, and evaluation methods of those standards , Maintain the existing documents relevant to this committee (e.g., glossary of automotive electronics terms, SAE J1213/1), Encourage the applicable industries, government and educational institutions to support the efforts of this committee.