This content is not included in
your SAE MOBILUS subscription, or you are not logged in.
Proton Interactions in Microelectronic Systems Flown in the Low-Earth Orbits Typical of Space Station
Annotation ability available
Sector:
Language:
English
Abstract
Proton-induced spallation reactions result in the generation of intense microscopic concentrations of ionizations, mostly generated along the trajectory of the recoiling nuclear fragment. A variety of single event effects can be induced if sufficient charge is generated near sensitive microstructures. The single event upset is the best understood of these effects, and the dependence of the cross section for inducing upsets on incident proton energy can be explained by a simple microdosimetric model which assumes an upset occurs if and only if a threshold number of ionizations are generated within a sensitive volume. Accurate predictions of upset rates requires accurate estimates of the threshold number of ionizations and the dimensions of the sensitive volume.
Recommended Content
Technical Paper | Rapid Soft Fault Recovery |
Technical Paper | The Fault Assumptions in Distributed Integrated Architectures |
Technical Paper | Cryogenics and ECLSS - Past, Present, and Future Challenges |
Authors
Topic
Citation
McNulty, P., "Proton Interactions in Microelectronic Systems Flown in the Low-Earth Orbits Typical of Space Station," SAE Technical Paper 961615, 1996, https://doi.org/10.4271/961615.Also In
References
- McNulty P.J. “Predicting Single Event Phenomena” Microelectronics for the Natural Radiation Environments of Space: Short Course for the 27 th International Nuclear and Space Radiation Effects Conference McNulty P.J. IEEE Reno, Nevada 1990 3 1 3 93
- Sexton Fred “Measurement of Single Event Phenomena in Devices and Ics,” Measurement and Analysis of Radiation Effects in Devices and ICs: Short Course for the 29 th International Nuclear and Space Radiation Effects Conference Sexton F.W. IEEE New Orleans, Louisiana 1992 3 1 3 55
- McNulty P.J. Roth D.R. Beauvais W.J. Abdel-Kader W.G. Stassinopoulos E.G. “Microdosimetry in Space Using Microelectronic Circuits,” Biological Effects and Physics of Solar and Galactic Cosmic Radiation Swenberg C.E. Horneck G Stassinopoulos E.G. Plenum Press New York 1993 165 180
- Goka T. Kuboyama S. Shimano Y. Kawanishi T. “The On-Orbit Measurements of Single-Event Phenomena by ETS-V Spacecraft,” IEEE Trans. Nucl. Sci. 38 1693 1699 1991
- Adams L. Daly E.J. Harboe-Sorensen R. Nickson R. Haines J. Schafer W. Conrad Greich H. Merkel J. Schwall T. “A Verified Proton-Induced Latchup in Space,” IEEE Trans. Nucl. Sci. 1804 1992
- Bruguier G. Palau J.M. “Single Particle-Induced Latchup,” IEEE Trans. Nucl. Sci. 522 532 1996
- Waskiewicz A.E. Groninger J.W. Strahan V.H. Long D.M. “Burnout of Power MOS Transistors with heavy ions of Californium 252,” IEEE Trans. Nucl. Sci. 33 1710 1713 1986
- Titus J.L. Wheatley C.F. “Experimental Studies of Single Event Gate Rupture and Burnout in Vertical Power MOSFETs,” IEEE Trans. Nucl. Sci. 43 533 545 1996
- Chen L. McNulty P.J. Larson S. Thompson D.A. Miller T.L Lee T. “Dark Current Induced in Large CCD Arrays by Proton-Induced Elastic Reactions and Single to Multiple Event Spallation Reactions,” IEEE Trans. Nucl. Sci. 41 1992 1998 1994
- Dale C.J. Chen L. McNulty P. J. Marshall P.W. Burke E.A. “A Comparison of Monte-Carlo and Analytical Treatments of Displacement Damage in Si Microvolumes,” IEEE Trans. Nucl. Sci. 41 1974 1983 1994
- Binder D. Smith E.C. Holeman A.B. “Satellite Anomalies from Galactic Cosmic Rays” IEEE Trans. Nucl. Sci. 22 2675 2680 1975
- May T.C. Woods M.H. “Alpha-Particle-Induced Soft Errors in Dynamic Memories” IEEE Trans. Elec. Dev. 26 2 1979
- Wyatt R.C. McNulty P.J. Toumbas P. Rothwell P.L. Filz R.C. “Soft Errors Induced by Energetic Protons” IEEE Trans. Nucl. Sci. 27 4905 4910 1979
- Guenzer C.S. Wolicki E.A. Alias R.G. “Single Event Upset of Dynamic RAMs by Neutrons and Protons” IEEE Trans. Nucl. Sci. 26 5048 1979
- Normand E. Baker T.J. “Altitude and Latitude Variations in Avionics SEU and Atmospheric Neutron Flux,” IEEE Trans. Nucl. Sci. 40 1484 1993
- McKee W.R. McCadams H.P. Smith E.B. McPherson J.W. Janson J.W. Ondrusek J.C. Hyslop A.E. Russell D.E. Coy R.A. Bergman D.W. Nguyen N.Q. Aton T. J. Block L.W. Huynh V.C. “Cosmic Ray Neutron Induced Upsets as a Major Contributor to the Soft Error Rate of Current and Future Generation DRAMs,”
- Bisgrove J. Lynch J.E. McNulty P.J. Abdel-Kader W.G. Kletnieks V. Kolasinski W.A. IEEE Trans. Nucl. Sci. NS-33 1571 1986
- McNulty P.J. Roth D.R. Beauvais W.J. Abdel-Kader W.G. Dinge D.C. “Comparison of the Charge Collecting Properties of Junctions and the SEU Response of Microelectronic Circuits’” Int. J. Radiat. Instrum., Part D, Nucl. Tracks Radiat. Meas. 19 1-4 929 938 1991
- McNulty P. J. Abdel-Kader W.G. Lynch J.E. “Modeling Charge Collection and Single Event Upsets in Microelectronics” Nuclear Instruments and Methods in Physics Research B61 1 52 60 1991
- McNulty P.J. Farrell G.E. Tucker W.P. IEEE Trans. Nucl. Sci. NS-28 4007 1981
- McNulty P. J. Abdel-Kader W.G. Farrell G.E. “Proton-Induced Spallation Reactions” Radiat. Phys. And Chem. 43 139 149 1994
- Metropolis N. Bivins R. Storm M. Turkevich A. Miller J.N. Friedlander G. Phys. Rev. 110 185 1958
- Dostrovsky I. Fraenkel Z. Friedlander G. Phys. Rev. 166 683 1959
- Abdel-Kader W.G. McNulty P.J. El-Teleaty S. Lynch J. Khondker A.N. “Estimating the Dimensions of the SEU-Sensitive Volume” IEEE Trans. Nucl. Sci. 34 1300 1987
- McNulty P.J. Beauvais W.J. Roth D.R. “Determination of SEU Parameters of NMOS and CMOS SRAMs,” IEEE Trans. Nucl. Sci. 38 1463 1470 1991
- Reed R.A. McNulty P.J. Beauvais W.J. Roth D.R. “Charge Collection Spectroscopy,” IEEE Trans. Nucl. Sci. 40 1876 1884 1993
- McNulty P.J. Beauvais W.J. Reed R.A. Roth D.R. Stassinopoulos E.G. Brucker G. L. “Charge Collection at Large Angles of Incidence” IEEE Trans. Nucl. Sci. 39 1622 1629 1992
- Stassinopoulos E.G. Brucker G.J. Van Gunten O. Kim H.S. “Variation in SEU Sensitivity of Dose-Imprinted CMOS SRAMs” IEEE Trans. Nucl. Sci. 36 2330 1989
- Sexton F.W. Fu J.S. Kohler R.A. Koga R. “SEU Characterization of a Hardened CMOS 64K and 256 K SRAM” IEEE Trans. Nucl. Sci. 36 2311 1989
- McLean F.B. Oldham T.R. “Charge Funneling in N- and P- type Si Substrates” IEEE Trans. Nucl. Sci. 29 2108 1982
- Golke K.W. “Determination of Funnel Length from Cross section versus LET Measurements” IEEE Trans. Nucl. Sci. 40 1910 1917 1993
- Petersen E.L. Pickel J.C. Smith E.C. Rudek P.J. Letaw J.R. “Geometrical Factors in SEE Rate Calculations” IEEE Trans. Nucl. Sci. 40 1888 1909 1993
- McNulty P.J. Abdel-Kader W.G. Beauvais W.J. Adams L. Daly E.J. Harboe-Seorensen R. “Simple Model for Proton-Induced Latch-up” IEEE Trans. Nucl. Sci. 40 1947 1951 1993
- Beauvais W.J. McNulty P.J. Abdel-Kader W.G. “SEU parameters and Proton Induced Upsets” Proceedings of the 2 nd European Conference on Radiation and Its Effects on Devices and Systems September 13-16 Saint Malo (France) 1993 540
- Reed R.A. McNulty P.J. Abdel-Kader W.G. “Implications of Angle of Incidence in SEU Testing of Modern Rad-Hard Circuits” IEEE Trans. Nucl. Sci. 41 2049 2054 1994
- McNulty P. J. Roth D.R. Kindall K.J. Thompson A.V. “Dependence on Angle of Incidence for Neutron-Induced SEU IEEE Trans.
- Reed R.A. McNulty P.J. Beauvais W.J. Abdel-Kader W.G. Stassinopoulos E.G. Barth J.C.L. “A Simple Algorithm for Predicting SEE Rates in Space Compared to the Rates Measured in Space on the CRRES Satellite” IEEE Trans. Nucl. Sci. 41 2389 2395 1994
- Bond V.P. Varma M.N. “Low-Level Radiation Response Explained in Terms of Fluence and Cell Critical Volume Dose” Eight Symposium on Microdosimetry Booz J. Ebert H.G. Julich West Germany Commision of the European Communities 1983 423 439
- Sondhaus C.A. Bond V.P. Feinendegen L.E. “Cell Oriented Alternatives to Dose, Quality Factor, and Dose Equivalent for Low-Level Radiation” Health Physics 59 35 48 1990
- McNulty P.J. Roth D.R. Stassinopoulos E.G. Stapor W.J. “Characterizing Complex Radiation Environments Using MORE (Monitor of Radiation Effects)” Symposium on Detector Research and Development for the Superconducting Super Collider Dombeck T. Kelly Valerie Yost G.P. World Scientific New Jersey 1990 690 692
- Roth D.R. McNulty P.J. Beauvais W.J. Reed R.A. Stassinopoulos E.G. “Solid-State Microdosimeter for Radiation Monitoring in Spacecraft and Avionics” IEEE Trans. Nucl. Sci. 41 2118 2124 1994
- Marshall P.W. Dale C.J. Carts M.A. LaBel K.A. “Particle Bit Errors in High Performance Fiber Optic Data Links for Satellite Data Management” IEEE Trans. Nucl. Sci. 41 1958 1965 1994