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The Use of an Optical Interference Method to Measure Erosion Rates of Automotive Clearcoats
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English
Abstract
The ultimate durability of automotive topcoats is affected by many factors. In recent years, several new methods have been used to study clearcoat degradation including electron spin resonance, hydroperoxide titration, dynamic mechanical spectroscopy, and FT-IR spectroscopy. One important aspect of clearcoat degradation which affects interpretation of the results of all these methods is erosion. Erosion can be caused by a variety of environmental and chemical factors. Measurement of clearcoat erosion has been attempted with limited success by weight loss and FT-IR measurements. This paper will describe an accurate method for determining erosion rates by an optical interference method. This method will be used to demonstrate the effect of light stabilizers on erosion rates.
Authors
Citation
Holt, M. and Iyengar, R., "The Use of an Optical Interference Method to Measure Erosion Rates of Automotive Clearcoats," SAE Technical Paper 950798, 1995, https://doi.org/10.4271/950798.Also In
References
- Gerlock J. L. Dearth M. A. Korniski T.J. “Reaction of Benzotriazole UV Absorbers with Free Radicals” Nov. 9 1994 Detroit Michigan
- Kämpf G. “A Survey of Methods for Measuring the Thickness of Paint Films” Progress in Organic Coatings 1 1973 335 350
- Latter T.D. “What is Difficult in Measuring the Thickness of a Coating” Product Finishing March 1984 21 27
- Latter T. D. “Measuring the Thickness of Protective Coatings by Eddy Current Techniques.” Product Finishing April 1972 34 36
- Latter T. D. “Coating Thickness Gauges, Instruments or Gadgets” Anti-Corrosion April 1976 5 10
- Mar A. Holt M. “Hindered Amino Ethers: A New Class of Radical Scavengers” Water-Borne and Higher Solids Coatings Symposium Feb. 1990 New Orleans
- Machler, M. (Continuously Aligned Diode-Array Simultaneous Spectrometer - Solving a Problem with Opto-electronic Equipment) 96 1988 1-2 13 Machler, M. Schlemmer, H. 30 1989 100
- Koch, K.P. Mächler, M. Glück, F. Application of diode array spectrometers in microscope photometry Rev. Sci. Instru. 56 1985 12 2243
- Rohde, A. (Layer Thickness Measurement with the Diode Array Spectrometer) 1988 6 260
- Larson, D. L. NBS Research Report NBS IR 81-1652 1981