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A Comparison of Physical Layer Devices for Class B and Class C Multiplex Systems. (Using Recommended Practice
SAE J1699
for Testing Physical Layer Devices.)
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Language:
English
Abstract
The objective of this paper is to suggest the advantages of using SAE J1699 tests and methods as a basis for characterization of physical layer devices. This paper will examine some of the commercially available physical layer IC's that could be used to drive Class B and C multiplex networks. Device characteristics such as propagation delays, current consumption, and common mode will be presented. These characteristics could be used to test device performance in Class B and Class C multiplex applications. Also presented will be an introduction to the new SAE J1699 Recommended Practice for multiplex device testing and how J1699 might be used for physical layer device testing.
Authors
Citation
Zachos, M., Stone, M., and Eisenhart, S., "A Comparison of Physical Layer Devices for Class B and Class C Multiplex Systems. (Using Recommended PracticeAlso In
References
- SAE J1699 Draft December 1993
- SAE J1850 November 1993
- SAE J1939 October 1993
- 82C250 Device Data Sheet, Philips Semiconductor
- Si9200 Device Data Sheet. Siliconix Corp.
- CF15B Device Data Sheet, Bosch Microelectronics
- SN75176 Device Data Sheet, Texas Instruments Co.