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SAFT Nickel-Cadmium Lifetime and Reliability
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English
Abstract
The first part of this document gives the reliability number for SAFT cells. This calculation covers the entire SAFT NiCd cell experience: on ground and on board satellites under LEO and GEO conditions. The second part describes a lifetime model. This model is based on a Weibull distribution and the Arrhenius law, taking into account the following parameters: Temperature, DOD, percentage of failed cells and overcharge current.
Authors
Citation
Puig, O., "SAFT Nickel-Cadmium Lifetime and Reliability," SAE Technical Paper 929327, 1992, https://doi.org/10.4271/929327.Also In
References
- Scott W.R. Rusta D. NiCd battery applications manual
- Fedors R.F. Cizmecioglu M. Hong S.D. Gupta A. Moacanin J. A failure model for sealed nickel-cadmium batteries Journal of power sources 8 1982 369 384
- Hendel B. Dudley G. Gave G. Update on Low-earth orbit nickel cadmium battery lifetime testing European space power conference 1991
- Verniolle J. Test simulation of more than 10 year geostationary operation of NiCd batteries under high depth of discharge 26th IECEC 1991