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Equipment and Methods of X-Ray Stress Analysis
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English
Abstract
The measurement of stress by x-ray diffraction techniques is considered from both the technical and practical viewpoints. Basic principles are discussed and the techniques and x-ray instrumentation presently in use here and abroad are described and compared from the standpoints of accuracy, precision, and time required for stress determination. Both diffractometer and film or camera techniques are covered. Other factors discussed are alignment requirements, selection of optimum instrumental conditions, required corrections to raw diffractometer data, specimen surface preparation, and stress constant evaluation methods.
Step-by-step procedures for the novice with illustrations of typical data and calculations are finally presented for the two exposure and sin2ψ diffractometer techniques and for the two-exposure camera method.
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Citation
Jatczak, C., "Equipment and Methods of X-Ray Stress Analysis," SAE Technical Paper 720242, 1972, https://doi.org/10.4271/720242.Also In
References
- SAE J936 Methods of Residual Stress Measurement SAE Handbook Supplement HS J936 1965
- Ricklefs R. L. Evans W. P. “Anomalous Residual Stresses.” Advances in X-Ray Analysis 10 1966 273
- SAE J793 Evaluation of Methods for Measurement of Residual Stress SAE Handbook Supplement 147 1957
- SAE J784a Residual Stress Measurement by X-Ray Diffraction SAE Handbook Supplement HS J784a 1971
- Zantopulos H. Jatczak C. F. “Systematic Errors in X-Ray Diffractometer Stress Measurements Due to Specimen Geometry and Beam Divergence.” Advances in X-Ray Analysis 14 1971 360
- French D. N. MacDonald B. A. “Experimental Methods of X-Ray Stress Analysis.” Experimental Mechanics October 1969 456
- Moore M. G. Evans W. P. “Mathematical Corrections for Stress in Removed Layers in X-Ray R.S. Analysis.” SAE Transactions 66 1958 340