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Application of the Scanning Electron Microscope/X-Ray Spectrometer to Automobile Exhaust Particulates
ISSN: 0148-7191, e-ISSN: 2688-3627
Published February 01, 1971 by SAE International in United States
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The advantages of using the scanning electron microscope (SEM) to characterize automotive particles are described. The sample, collected using an Andersen sampler, is bombarded with electrons and the resultant x-rays are analyzed with an energy dispersive spectrometer.
After many particles were observed, classifications were made for individual particles of one structural type greater than 3 μ in size; agglomerates, single masses of particles less than 1 μ; fines, particles of 500-1000 Å; and atypical particles.
It is felt that with the advances in methods and technology this procedure will provide a strong basis for future sampling characterization and identification.