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Standardized Techniques for the Selection of Hi-Rel Microelectronics
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English
Abstract
The use of microelectronic devices in electronic equipment always obviates problems for the Design Engineer in the design of a compact, light-weight, highly reliable, high-vibration-withstanding and shock resistant system. Certain of the above descriptive objectives are automatic with the inclusion of microelectronic devices, others are available, at a definite price. This paper will deal with the selection of the proper supplier to obtain high quality microelectronic devices through the use of appropriate specifications, military and industrial.
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Citation
Slaughter, E., "Standardized Techniques for the Selection of Hi-Rel Microelectronics," SAE Technical Paper 670643, 1967, https://doi.org/10.4271/670643.Also In
References
- Nowak T. J. “Reliability of Integrated Circuits By Screening,” Proceeding of 1967 Annual Symposium on Reliability January 10-12 1967 365 375
- Mulcahy D. L. “Selecting and Specifying Hi-Rel Integrated Circuits,” Proceeding of 1967 Annual Symposium on Reliability January 10-12 1967 359 364
- Grossman R. A. “Detecting Flaws in Integrated Circuit,” Electronic Products Magazine May 1966 26 28
- Peralta B. C. “Screening Silicon Integrated Circuits,” Proceeding of 1967 Annual Symposium on Reliability January 10-12 1967 348