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Intrinsic to Operational Reliability and Maintainability - A Credibility Gap?
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English
Abstract
The nature and magnitude of differences between intrinsic and operational reliability and maintainability characteristics are presented. Relative supplier and user responsibility is cited. The difficulty is justifying increased reliability and maintainability is illustrated by means of hypothetical equipment selection and direct mutual dependence of reliability and maintainability is demonstrated. A suggested approach to the reconciliation of intrinsic and operational values consists on recognition of mutual responsibilities of supplier and user, development of a clear conditional frame of reference for intrinsic claims, user, development of a clear conditional frame of reference for intrinsic claims, and application of more effective operational management controls. Data bank requirements for this approach are also established.
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Citation
Zak, E., "Intrinsic to Operational Reliability and Maintainability - A Credibility Gap?," SAE Technical Paper 670627, 1967, https://doi.org/10.4271/670627.Also In
References
- “Long Range Economy Seen in Burn-in Tests,” Aviation Week and Space Technology January 30 1967
- “New Data Yield Clues to Reliability,” Aviation Week and Space Technology February 13 1967
- Golant Allan S. “Comparison of MIL-HDBK-217A and MIL-HDBK-217,” Electronic Specialty Co. Los Angeles, California Published in Proceedings of 1967 Annual Symposium on Reliability, IEEE Catalogue Number 7C50
- Adkins, L. A. Jr. “C-141 Reliability Flight Test Program,” Reliability Engineering Department, Lockheed-Georgia Company Marietta, Georgia Published in Proceedings of 1967 Annual Symposium on Reliability, IEEE Catalogue Number 7C50
- Hausrath D. A. Dr. Fleming D. C. “Cost Improvement as a Result of Reliability Efforts on Minuteman II Integrated Circuits,” Autonetics, Division of North American Aviation, Inc. Anaheim, California Published in Proceedings of 1967 Annual Symposium on Reliability, IEEE Catalogue Number 7C50
- Zak E. T. “Reliability and Maintainability (RAM) Interface,” Guidance and Controls Systems Division, Litton Systems, Inc. Published in 1966 IEEE Region Six Conference Record