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A Sampling and Conditioning Particle System for Solid Particle Measurements Down to 10 nm

Journal Article
2019-24-0154
ISSN: 2641-9637, e-ISSN: 2641-9645
Published September 09, 2019 by SAE International in United States
A Sampling and Conditioning Particle System for Solid Particle Measurements Down to 10 nm
Sector:
Citation: Chasapidis, L., Melas, A., Tsakis, A., Zarvalis, D. et al., "A Sampling and Conditioning Particle System for Solid Particle Measurements Down to 10 nm," SAE Int. J. Adv. & Curr. Prac. in Mobility 2(2):702-709, 2020, https://doi.org/10.4271/2019-24-0154.
Language: English

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