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SAE ARP6338: Process for Assessment and Mitigation of Aging and Potential Early Wearout of Life-Limited Microcircuits (LLM)

Journal Article
2019-01-1254
ISSN: 2641-9645, e-ISSN: 2641-9645
Published April 02, 2019 by SAE International in United States
SAE ARP6338: Process for Assessment and Mitigation of Aging and Potential Early Wearout of Life-Limited Microcircuits (LLM)
Sector:
Citation: Condra, L., Alagappan, A., and Hillman, C., "SAE ARP6338: Process for Assessment and Mitigation of Aging and Potential Early Wearout of Life-Limited Microcircuits (LLM)," SAE Int. J. Adv. & Curr. Prac. in Mobility 1(4):1653-1660, 2019, https://doi.org/10.4271/2019-01-1254.
Language: English

References

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