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The Depth Limits of Eddy Current Testing for Defects: A Computational Investigation and Smooth-Shaped Defect Synthesis from Finite Element Optimization

Journal Article
2015-01-0595
ISSN: 1946-3979, e-ISSN: 1946-3987
DOI: https://doi.org/10.4271/2015-01-0595
Published April 14, 2015 by SAE International in United States
The Depth Limits of Eddy Current Testing for Defects: A Computational Investigation and Smooth-Shaped Defect Synthesis from Finite Element Optimization
Sector:
Citation: Mathialakan, T., Karthik, V., Jayakumar, P., Thyagarajan, R. et al., "The Depth Limits of Eddy Current Testing for Defects: A Computational Investigation and Smooth-Shaped Defect Synthesis from Finite Element Optimization," SAE Int. J. Mater. Manf. 8(2):450-457, 2015, https://doi.org/10.4271/2015-01-0595.
Language: English

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