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Design of Reactive Security Mechanisms in Time-Triggered Embedded Systems

Journal Article
2014-01-0341
ISSN: 1946-4614, e-ISSN: 1946-4622
DOI: https://doi.org/10.4271/2014-01-0341
Published April 01, 2014 by SAE International in United States
Design of Reactive Security Mechanisms in Time-Triggered Embedded Systems
Sector:
Citation: Trawczynski, D., Zalewski, J., and Sosnowski, J., "Design of Reactive Security Mechanisms in Time-Triggered Embedded Systems," SAE Int. J. Passeng. Cars – Electron. Electr. Syst. 7(2):527-535, 2014, https://doi.org/10.4271/2014-01-0341.
Language: English

Abstract:

In the paper we discuss how a single node communication interface failure in a time-triggered system can be used to model a DoS-type attack. More so, we present a design approach based on active detection of common DoS characteristics, which can serve as a template for attack detection. This approach is feasible in time-triggered systems because of the periodic and deterministic characteristics either at the fieldbus communication or application level. We support our discussion with an example case study of a vehicle braking system implementing time-triggered messages disturbed by fault injection.

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