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Qualitative Analysis of Induction Process of Anisotropic Structures in Titanium Thin Films
Technical Paper
2013-36-0580
ISSN: 0148-7191, e-ISSN: 2688-3627
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Language:
English
Abstract
The obtaining of thin films of titanium, through physical deposition techniques, it is shown as a recurring research topic in the scientific community. The intrinsic mechanisms associated with quantum processes of these materials are justifications for their specific applications. The structural analysis of thin films it reveals of significant importance due to the fact of the presence of discontinuities, for example, that influence the electrical impedance presented by the coating. The present work refers to the comparative study of procedures, and the design of devices, which induce the formation of random discontinuities in thin films of titanium with nanometers thickness. Such discontinuities are generated by different techniques, in order to promote changes in surface properties, for example, the value of electrical resistivity of these coatings.
Authors
Citation
de Quadros, H., Soethe, V., Rejas, P., and Rezende, M., "Qualitative Analysis of Induction Process of Anisotropic Structures in Titanium Thin Films," SAE Technical Paper 2013-36-0580, 2013, https://doi.org/10.4271/2013-36-0580.Also In
References
- INTERNATIONAL ENCYCLOPAEDIA OF COMPOSITES 6 VHC Publishers New York 1991
- JAFELICCI JR. , M. Irr. II Encontro Técnico de Materiais e Química 16 18 Rio de Janeiro IPQM 1997
- INTERAVIA Hiding from radar Interavia 11 1 191 1.192 1988
- GAMA , A. M. et al. Journal of Magnetism and Magnetic Materials 323 22 2782 2785 2011
- FOLGUERAS , L. C. , REZENDE , M. C. Materials Research 11 245 2008
- BISCARO , R. S. ; FAEZ , R. , REZENDE , M. C. Polymers for Advanced Technologies 19 151 2008
- FOLGUERAS , L. C. , REZENDE , M. C. Materials Research 11 245 2008
- FOLGUERAS , L. C. , ALVES , M. A. , REZENDE , M. C. Materials Research 13 197 2010
- JOHNSON , R.N. International Coutermeasures Handbook 11 th E.W. Communications Palo Alto 1992
- KIM , J.B. , LEE , S.K. , KIM , C.G. Composites Science and Technology 2007
- LIN , H. , ZHU , H. , GUO , H. , YU , L. Materials Research Bulletin China 2007 MAYES , E. US Patent N ° 6986942 2006
- SKOLNIK , M.I. Radar Handbook Nova York McGraw Hill Book Company 1970
- STONIER , R.A. Society of Aerospace Materials and Process Engineering-SAMPE Journal 27 4 9 17 1991
- SOETHE , Viviane Lilian Filmes Finos Absorvedores de Microondas obtidos pelo processo de Deposição Física em fase vapor 2009 305 Tese de doutorado em Física de Plasma Instituto Tecnológico de Aeronáutica, São José dos Campos
- SAAB BARRACUDA www.barracuda.se 2011
- CHENG , D.K. Field and Wave Electromagnetics 2 1992
- OHRING , M. The Materials Science of Thin Films Stevens Institute of Technology, Academic Press San Diego 1991
- ISHII , N. , YAKASAKA , Y. U.S. Patent N ° 6823816 2004
- NUSSENZVEIGH , H.M. Curso de Física Básico - Eletromagnetismo 3 1997
- 2 BOSMAN , H. , LAU , Y.Y. , GILGENBACH , R.M. IEEE Transactions on Plasma Science 32 3 2004
- GIROTTO , Emerson M. ; SANTOS , Ivair A. Química Nova São Paulo 25 4 1 10 2002
- KNOTT , E.F. ; SCHAEFFER , J.F. & Tuley , M.T. Radar Cross Section Artech House Inc. New Jersey 1985
- SMITH , D.L. Thin film Deposition - Principles & Practice McGraw-Hill 1995