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Low Cost Development Strategy for Pre-Compliance Electromagnetic Compatibility (EMC) Tests with a Transverse Electromagnetic (TEM) Cell
Technical Paper
2012-36-0302
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
During development of electronic products, several measurements are performed to ensure the electromagnetic disturbances are in such levels permitted by costumer requirements. Normally these tests are performed in certified laboratories. This usually causes high impact on timing plan and development costs. In order to reduce the time and cost involved on pre-compliance EMC tests, a Transverse Electromagnetic (TEM) cell was used as a tool for fast analysis of proposed design solutions during development of a brushless motor controller. The TEM was used as an Antenna to measure the electromagnetic disturbances (magnetic field) generated by the EUT (Equipment Under Test). A mathematical correlation between the voltage measured using the Antenna (TEM) and results found in a Certified Laboratory are compared and presented.
Authors
Citation
Bronzeri, R., Filho, A., Nascimento, E., and de C. Meira, J., "Low Cost Development Strategy for Pre-Compliance Electromagnetic Compatibility (EMC) Tests with a Transverse Electromagnetic (TEM) Cell," SAE Technical Paper 2012-36-0302, 2012, https://doi.org/10.4271/2012-36-0302.Also In
References
- CISRP 25 IEC 2008
- HEALD, M. A. MARION, J. B. Classical Electromagnetic Radiation third Saunders College Publishing Fort Worth 1980 0-03-097277
- Fiori, F. Musolino, F. Measurement of Integrated Circuit Conducted Emissions by Using a Transverse Electromagnetic Mode (TEM) Cell IEEE Trans. Electromagn. Compat. 43 4 622 628 Nov. 2001
- Melling do Brasil internal file SDTE 170-12