This content is not included in
your SAE MOBILUS subscription, or you are not logged in.
Residual Stress Measurement using X-Ray Diffraction Techniques, Guidelines and Normative Standards
Journal Article
2012-01-0186
ISSN: 1946-3979, e-ISSN: 1946-3987
Sector:
Topic:
Citation:
Belassel, M., "Residual Stress Measurement using X-Ray Diffraction Techniques, Guidelines and Normative Standards," SAE Int. J. Mater. Manf. 5(2):352-356, 2012, https://doi.org/10.4271/2012-01-0186.
Language:
English
References
- Noyan, I. C. Cohen, J. B. “Residual Stress - Measurement by Diffraction and Interpretation” Springer-Verlag New York 1987
- Cullity, B. D. “Elements of X-ray Diffraction” Second Addison-Wesley Reading Massachusetts 1978
- ASTM E915-10 “Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement1” 2010
- European Standard “Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction” 2008
- Belassel, M. Bocher, E. Pineault, J. “Effect of Detector Width and Peak Location Technique on Residual Stress Determination in Case of Work-Hardened Materials Materials Science Forum 524-525 2006 755 760
- Lu, J. et al. “Handbook of Measurement of Residual Stress” Fairmont Press 1996
- Li, V. Ji, J.L. Lebrun, G.E. “Surface Roughness on Stress Determination by the X-Ray Diffraction Technique,” Exp. Tech. 19 2 March April 1995 9 11
- Pineault, J. et al. “X-Ray Diffraction Residual Stress Measurement in Failure Analysis” ASM Handbook 11 2002 484 497
- Hauk, V. “Structural and Residual Stress Analysis by Nondestructive Methods Elsevier 1997